Frederic Duvivier

According to our database, Frederic Duvivier authored at least 6 papers between 1993 and 1999.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of six.

1999

Automatic Detection of Spatial Signature on Wafermaps in a High Volume Production.

Frederic Duvivier

Proceedings of the 14th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '99), 1999

1998

Management of Critical Areas and Defectivity Data for Yield Trend Modeling.

Sandrine Barberan, Frederic Duvivier

Proceedings of the 13th International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT '98), 1998

1997

Application of a yield model merging critical areas and defectivity to industrial products.

Sandra Levasseur, Frederic Duvivier

Proceedings of the 1997 Workshop on Defect and Fault-Tolerance in VLSI Systems (DFT '97), 1997

1996

Application of a Survey Sampling Critical Area Computation Tool in a Manufacturing Environment.

Frederic Duvivier, Gerard A. Allan

Proceedings of the 1996 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 1996

1995

Approximation of critical area of ICs with simple parameters extracted from the layout.

Frederic Duvivier, M. Rivier

Proceedings of the 1995 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 1995

1993

Use of a Segmentation Technique to Analyze the Variability of the Yield of a Mature CMOS SRAM.

Frederic Duvivier, M. Rivier, B. Burtschy, J. J. Charlot

Proceedings of the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems, 1993