Frans P. M. Beenker

According to our database, Frans P. M. Beenker authored at least 11 papers between 1985 and 1993.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

1993

Minimizing Test Time by Exploiting Parallelism in Macro Test.

Hans Bouwmeester, Steven Oostdijk, Frank Bouwman, Rudi Stans, Loek Thijssen, Frans P. M. Beenker

Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993

1992

Macro Testability: The Results of Production Device Applications.

Frank Bouwman, Steven Oostdijk, Rudi Stans, Ben Bennetts, Frans P. M. Beenker

Proceedings of the Proceedings IEEE International Test Conference 1992, 1992

1990

A realistic fault model and test algorithms for static random access memories.

Rob Dekker, Frans P. M. Beenker, Loek Thijssen

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1990

Implementing Macro Test in Silicon Compiler Design.

Frans P. M. Beenker, Barry J. Dekker, Richard Stans, Max van der Star

IEEE Des. Test Comput., 1990

1989

Realistic built-in self-test for static RAMs.

Rob Dekker, Frans P. M. Beenker, Loek Thijssen

IEEE Des. Test, 1989

A Testability Strategy for Silicon Compilers.

Frans P. M. Beenker, Rob Dekker, Rudi Stans, Max van der Star

Proceedings of the Proceedings International Test Conference 1989, 1989

1988

A Realistic Self-Test Machine for Static Random Access Memories.

Frans P. M. Beenker, Rob Dekker, Loek Thijssen

Proceedings of the Proceedings International Test Conference 1988, 1988

Fault Modeling and Test Algorithm Development.

Frans P. M. Beenker, Rob Dekker, Loek Thijssen

Proceedings of the Proceedings International Test Conference 1988, 1988

1986

Macro Testing: Unifying IC and Board Test.

Frans P. M. Beenker, Karel J. E. van Eerdewijk, Robert B. W. Gerritsen, Frank N. Peacock, Max van der Star

IEEE Des. Test, 1986

Design-for-testability of PLA's using statistical cooling.

Michiel M. Ligthart, Emile H. L. Aarts, Frans P. M. Beenker

Proceedings of the 23rd ACM/IEEE Design Automation Conference. Las Vegas, 1986

1985

Systematic and Structured Methods for Digital Board Testing.

Frans P. M. Beenker

Proceedings of the Proceedings International Test Conference 1985, 1985