Frank Poehl

According to our database, Frank Poehl authored at least 8 papers between 1999 and 2012.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2012

Highly Efficient Test Response Compaction Using a Hierarchical X-Masking Technique.

Thomas Rabenalt, Michael Richter, Frank Poehl, Michael Gössel

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012

2010

Production test challenges for highly integrated mobile phone SOCs - A case study.

Frank Poehl, Frank Demmerle, Juergen Alt, Hermann Obermeir

Proceedings of the 15th European Test Symposium, 2010

2007

On-chip evaluation, compensation and storage of scan diagnosis data.

Frank Poehl, Matthias Beck, Ralf Arnold, Jan Rzeha, Thomas Rabenalt, Michael Gössel

IET Comput. Digit. Tech., 2007

2006

On-Chip Evaluation, Compensation, and Storage of Scan Diagnosis Data - A Test Time Efficient Scan Diagnosis Architecture.

Frank Poehl, Jan Rzeha, Matthias Beck, Michael Gössel, Ralf Arnold, Peter Ossimitz

Proceedings of the 11th European Test Symposium, 2006

2005

Measures to Improve Delay Fault Testing on Low-Cost Testers - A Case Study.

Matthias Beck, Olivier Barondeau, Frank Poehl, Xijiang Lin, Ron Press

Proceedings of the 23rd IEEE VLSI Test Symposium (VTS 2005), 2005

Logic Design for On-Chip Test Clock Generation - Implementation Details and Impact on Delay Test Quality.

Matthias Beck, Olivier Barondeau, Martin Kaibel, Frank Poehl, Xijiang Lin, Ron Press

Proceedings of the 2005 Design, 2005

2003

Industrial Experience with Adoption of EDT for Low-Cost Test without Concessions.

Frank Poehl, Matthias Beck, Ralf Arnold, Peter Muhmenthaler, Nagesh Tamarapalli, Mark Kassab, Nilanjan Mukherjee, Janusz Rajski

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

1999

Quality Determination for Gate Delay Fault Tests Considering Three-State Elements.

Frank Poehl, Walter Anheier

J. Electron. Test., 1999