Frank Altmann

Orcid: 0000-0002-0202-1193

According to our database1, Frank Altmann authored at least 20 papers between 2006 and 2024.

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Bibliography

2024
Co3O4-Based Materials as Potential Catalysts for Methane Detection in Catalytic Gas Sensors.
Sensors, April, 2024

2023
Modulation to the Rescue: Identifying Sub-Circuitry in the Transistor Morass for Targeted Analysis.
CoRR, 2023

Modulation to the Rescue: Identifying Sub-Circuitry in the Transistor Morass for Targeted Analysis.
Proceedings of the 2023 Workshop on Attacks and Solutions in Hardware Security, 2023

2021

Thermal source separation for 3D defect localization using independent component analysis (ICA) from time-resolved temperature response (TRTR).
Proceedings of the 17th IEEE International Conference on Automation Science and Engineering, 2021

2020
Reliability Physics of GaN HEMT Microwave Devices: The Age of Scaling.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019
New Access to Soft Breakdown Parameters of Low-k Dielectrics Through Localisation-Based Analysis.
Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018
Physical failure analysis methods for wide band gap semiconductor devices.
Proceedings of the IEEE International Reliability Physics Symposium, 2018

2017
Exploring the thermal limit of GaN power devices under extreme overload conditions.
Microelectron. Reliab., 2017

High resolution physical analysis of ohmic contact formation at GaN-HEMT devices.
Microelectron. Reliab., 2017

2016
Novel failure mode of chip corrosion at automotive HALL sensor devices under multiple stress conditions.
Microelectron. Reliab., 2016

Reliability evaluation of Si-dies due to assembly issues.
Microelectron. Reliab., 2016

Magnetic field and current density imaging using off-line lock-in analysis.
Microelectron. Reliab., 2016

Correlation of gate leakage and local strain distribution in GaN/AlGaN HEMT structures.
Microelectron. Reliab., 2016

Detection and analysis of stress-induced voiding in Al-power lines by acoustic GHz-microscopy.
Microelectron. Reliab., 2016

Innovative Failure Analysis Techniques for 3-D Packaging Developments.
IEEE Des. Test, 2016

2014
Advanced FIB sample preparation techniques for high resolution TEM investigations of HEMT structures.
Microelectron. Reliab., 2014

2012
Novel techniques for dopant contrast analysis on real IC structures.
Microelectron. Reliab., 2012

2010
Dynamic lock-in thermography for operation mode-dependent thermally active fault localization.
Microelectron. Reliab., 2010

2006
Lock-in thermal IR imaging using a solid immersion lens.
Microelectron. Reliab., 2006


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