François Dieudonné

According to our database, François Dieudonné authored at least 3 papers between 2001 and 2004.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2004

On the defects introduced by AC and DC hot carrier stress in SOI PD MOSFETs.

M. A. Exarchos, François Dieudonné, Jalal Jomaah, George J. Papaioannou, Francis Balestra

Microelectron. Reliab., 2004

2003

Low frequency noise in 0.12 mum partially and fully depleted SOI technology.

François Dieudonné, Sébastien Haendler, Jalal Jomaah, Francis Balestra

Microelectron. Reliab., 2003

2001

An overview of hot-carrier induced degradation in 0.25 mum Partially and Fully Depleted SOI N-MOSFET's.

François Dieudonné, F. Daugé, Jalal Jomaah, C. Raynaud, Francis Balestra

Microelectron. Reliab., 2001