Franco Zanon

According to our database, Franco Zanon authored at least 6 papers between 2006 and 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2017

Four-point bending cycling: The alternative for thermal cycling solder fatigue testing of electronic components.

Bart Vandevelde, Filip Vanhee, Davy Pissoort, Lieven Degrendele, Johan de Baets, Bart Allaert, Ralph Lauwaert, Franco Zanon, Riet Labie, Geert Willems

Microelectron. Reliab., 2017

Improved and accurate physics-of-failure (PoF) methodology for qualification and lifetime assessment of electronic systems.

Abdellatif Bey-Temsamani, S. Kauffmann, Y. Descas, Bart Vandevelde, Franco Zanon, Geert Willems

Microelectron. Reliab., 2017

2009

Reliability analysis of AlGaN/GaN HEMT on SopSiC composite substrate under long-term DC-life test.

Nicolo Ronchi, Franco Zanon, Antonio Stocco, Augusto Tazzoli, Enrico Zanoni, Gaudenzio Meneghesso

Microelectron. Reliab., 2009

2008

Electrical characterization and reliability study of HEMTs on composite substrates under high electric fields.

Augusto Tazzoli, Gaudenzio Meneghesso, Franco Zanon, Francesca Danesin, Enrico Zanoni, Philippe Bove, R. Langer, J. Thorpe

Microelectron. Reliab., 2008

Thermal storage effects on AlGaN/GaN HEMT.

Francesca Danesin, Augusto Tazzoli, Franco Zanon, Gaudenzio Meneghesso, Enrico Zanoni, Antonio Cetronio, Claudio Lanzieri, Simone Lavanga, Marco Peroni, Paolo Romanini

Microelectron. Reliab., 2008

2006

Degradation induced by 2-MeV alpha particles on AlGaN/GaN high electron mobility transistors.

Francesca Danesin, Franco Zanon, Simone Gerardin, Fabiana Rampazzo, Gaudenzio Meneghesso, Enrico Zanoni, Alessandro Paccagnella

Microelectron. Reliab., 2006