Francisco de Assis Boldt
Orcid: 0000-0001-6919-5377
According to our database1,
Francisco de Assis Boldt
authored at least 14 papers
between 2013 and 2024.
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Bibliography
2024
Proceedings of the 37th SIBGRAPI Conference on Graphics, Patterns and Images, 2024
2021
An experimental methodology to evaluate machine learning methods for fault diagnosis based on vibration signals.
Expert Syst. Appl., 2021
Proceedings of the IECON 2021, 2021
2020
Feature selection for multivariate contribution analysis in fault detection and isolation.
J. Frankl. Inst., 2020
2017
Cascade Feature Selection and ELM for automatic fault diagnosis of the Tennessee Eastman process.
Neurocomputing, 2017
Binary feature selection classifier ensemble for fault diagnosis of submersible motor pump.
Proceedings of the 26th IEEE International Symposium on Industrial Electronics, 2017
Kernel and random extreme learning machine applied to submersible motor pump fault diagnosis.
Proceedings of the 2017 International Joint Conference on Neural Networks, 2017
2015
Heterogeneous Feature Models and Feature Selection Applied to Bearing Fault Diagnosis.
IEEE Trans. Ind. Electron., 2015
Fast feature selection using hybrid ranking and wrapper approach for automatic fault diagnosis of motorpumps based on vibration signals.
Proceedings of the 13th IEEE International Conference on Industrial Informatics, 2015
Proceedings of the 27th IEEE International Conference on Tools with Artificial Intelligence, 2015
2014
Performance analysis of extreme learning machine for automatic diagnosis of electrical submersible pump conditions.
Proceedings of the 12th IEEE International Conference on Industrial Informatics, 2014
Evaluation of the Extreme Learning Machine for automatic fault diagnosis of the Tennessee Eastman chemical process.
Proceedings of the IECON 2014 - 40th Annual Conference of the IEEE Industrial Electronics Society, Dallas, TX, USA, October 29, 2014
2013
Computational intelligence for automatic diagnosis of submersible motor pump conditions in offshore oil exploration.
Proceedings of the 20th IEEE International Conference on Electronics, 2013
Proceedings of the 20th IEEE International Conference on Electronics, 2013