Francisco André Corrêa Alegria

According to our database, Francisco André Corrêa Alegria authored at least 25 papers between 2000 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

Study of the Bias of the Initial Phase Estimation of a Sinewave of Known Frequency in the Presence of Phase Noise.

Francisco André Corrêa Alegria, Lian Xie, Dario Jeronimo Pasadas

Sensors, June, 2024

Classification of Corrosion Severity in SPCC Steels Using Eddy Current Testing and Supervised Machine Learning Models.

Lian Xie, Prashanth Baskaran, Artur Lopes Ribeiro, Francisco André Corrêa Alegria, Helena Maria Geirinhas Ramos

Sensors, April, 2024

Uncertainty of the initial phase estimation of a sinewave in the presence of phase noise, additive noise or jitter.

F. Corrêa Alegria

J. Frankl. Inst., 2024

Expanding the IEEE 1057 Standard Jitter Test of Waveform Recorders to Include Simultaneous Voltage Noise Estimation.

Francisco André Corrêa Alegria

IEEE Access, 2024

2012

Choosing Between Terminal and Independently Based Gain and Offset Error in the ADC Histogram Test.

Francisco André Corrêa Alegria, Hugo Plácido da Silva

IEEE Trans. Instrum. Meas., 2012

Precision of harmonic amplitude estimation on jitter corrupted data using sine fitting.

F. Corrêa Alegria

Signal Process., 2012

2010

Liftoff Correction Based on the Spatial Spectral Behavior of Eddy-Current Images.

A. Lopes Ribeiro, Francisco André Corrêa Alegria, Octavian Adrian Postolache, Helena Maria Geirinhas Ramos

IEEE Trans. Instrum. Meas., 2010

Cross-Correlation and Sine-Fitting Techniques for High-Resolution Ultrasonic Ranging.

Ricardo Queirós, Francisco André Corrêa Alegria, Pedro Silva Girão, António Manuel da Cruz Serra

IEEE Trans. Instrum. Meas., 2010

Gaussian Jitter-Induced Bias of Sine Wave Amplitude Estimation Using Three-Parameter Sine Fitting.

F. Corrêa Alegria, A. Cruz Serra

IEEE Trans. Instrum. Meas., 2010

2009

IEEE 1057 Jitter Test of Waveform Recorders.

Shahram Shariat-Panahi, Francisco André Corrêa Alegria, Antoni Mánuel Lázaro, António Manuel da Cruz Serra

IEEE Trans. Instrum. Meas., 2009

The Histogram Test of ADCs With Sinusoidal Stimulus Is Unbiased by Phase Noise.

F. Corrêa Alegria, A. Cruz Serra

IEEE Trans. Instrum. Meas., 2009

Precision of Independently Based Gain and Offset Error of an ADC Using the Histogram Method.

F. Corrêa Alegria, A. Cruz Serra

IEEE Trans. Instrum. Meas., 2009

2008

Implementation Details of an Automatic Monitoring System Used on a Vodafone Radiocommunication Base Station.

F. Corrêa Alegria, Francisco Antonio Martins Travassos

Eng. Lett., 2008

2007

Standard Histogram Test Precision of ADC Gain and Offset Error Estimation.

F. Corrêa Alegria, A. Cruz Serra

IEEE Trans. Instrum. Meas., 2007

Developing and Integrating Lab Projects as Important Learning Components in an Embedded Systems Course.

Leonel Sousa, Francisco André Corrêa Alegria, José A. Germano

Proceedings of the IEEE International Conference on Microelectronic Systems Education, 2007

2006

ADC transfer curve types - A review.

F. Corrêa Alegria, A. Cruz Serra

Comput. Stand. Interfaces, 2006

2005

Overdrive in the ramp histogram test of ADCs.

Francisco André Corrêa Alegria, António Manuel da Cruz Serra

IEEE Trans. Instrum. Meas., 2005

Uncertainty of ADC random noise estimates obtained with the IEEE 1057 standard test.

Francisco André Corrêa Alegria, António Manuel da Cruz Serra

IEEE Trans. Instrum. Meas., 2005

Effective ADC linearity testing using sinewaves.

Francisco André Corrêa Alegria, Antonio Moschitta, Paolo Carbone, António Manuel da Cruz Serra, Dario Petri

IEEE Trans. Circuits Syst. I Regul. Pap., 2005

2004

Performance of data acquisition systems from the user's point of view.

Francisco André Corrêa Alegria, Pedro Silva Girão, Vladimír Haasz, A. Cruz Serra

IEEE Trans. Instrum. Meas., 2004

Analog-to-digital converter testing - new proposals.

A. Cruz Serra, F. Corrêa Alegria, Raul Carneiro Martins, Manuel Fonseca da Silva

Comput. Stand. Interfaces, 2004

2003

Variance of the cumulative histogram of ADCs due to frequency errors.

Francisco André Corrêa Alegria, António Manuel da Cruz Serra

IEEE Trans. Instrum. Meas., 2003

2002

Performance analysis of an ADC histogram test using small triangular waves.

Francisco André Corrêa Alegria, Pasquale Arpaia, António Manuel da Cruz Serra, Pasquale Daponte

IEEE Trans. Instrum. Meas., 2002

2001

Influence of frequency errors in the variance of the cumulative histogram [in ADC testing].

Francisco André Corrêa Alegria, António Manuel da Cruz Serra

IEEE Trans. Instrum. Meas., 2001

2000

Automatic calibration of analog and digital measuring instruments using computer vision.

Francisco André Corrêa Alegria, António Manuel da Cruz Serra

IEEE Trans. Instrum. Meas., 2000