Francis Balestra
According to our database1,
Francis Balestra
authored at least 16 papers
between 2000 and 2023.
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Book In proceedings Article PhD thesis Dataset OtherLinks
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Bibliography
2023
Experimental Study of Self-Heating Effect in InGaAs HEMTs for Quantum Technologies Down to 10K.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2022
In-depth electrical characterization of deca-nanometer InGaAs MOSFET down to cryogenic temperatures for low-power quantum applications.
Proceedings of the 52nd IEEE European Solid-State Device Research Conference, 2022
2021
Proceedings of the 14th IEEE International Conference on ASIC, 2021
2019
Proceedings of the 13th IEEE International Conference on ASIC, 2019
2017
Development and application of the Oxide Stress Separation technique for the measurement of ONO leakage currents at low electric fields in 40 nm floating gate embedded-flash memory.
Microelectron. Reliab., 2017
Proceedings of the 12th IEEE International Conference on ASIC, 2017
2012
Proceedings of the 2012 European Solid-State Device Research Conference, 2012
2009
Investigation of defects introduced by static and dynamic hot carrier stress on SOI partially depleted body-contact MOSFETs.
Microelectron. Reliab., 2009
2006
2005
The impact of static and dynamic degradation on SOI "smart-cut" floating body MOSFETs.
Microelectron. Reliab., 2005
2004
Microelectron. Reliab., 2004
2003
Microelectron. Reliab., 2003
2002
Microelectron. Reliab., 2002
2001
Microelectron. Reliab., 2001
An overview of hot-carrier induced degradation in 0.25 mum Partially and Fully Depleted SOI N-MOSFET's.
Microelectron. Reliab., 2001
2000
Proceedings of the 2000 7th IEEE International Conference on Electronics, 2000