Francesco Maria Puglisi
Orcid: 0000-0001-6178-2614
According to our database1,
Francesco Maria Puglisi
authored at least 31 papers
between 2012 and 2024.
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Bibliography
2024
IEEE Trans. Neural Networks Learn. Syst., April, 2024
2023
Reliability of HfO<sub>2</sub>-Based Ferroelectric FETs: A Critical Review of Current and Future Challenges.
Proc. IEEE, February, 2023
A Unified Framework to Explain Random Telegraph Noise Complexity in MOSFETs and RRAMs.
Proceedings of the IEEE International Reliability Physics Symposium, 2023
Proceedings of the IEEE International Reliability Physics Symposium, 2023
2022
Neuromorph. Comput. Eng., 2022
Smart Material Implication Using Spin-Transfer Torque Magnetic Tunnel Junctions for Logic-in-Memory Computing.
CoRR, 2022
Proceedings of the IEEE International Reliability Physics Symposium, 2022
Combining Experiments and a Novel Small Signal Model to Investigate the Degradation Mechanisms in Ferroelectric Tunnel Junctions.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
Proceedings of the 52nd IEEE European Solid-State Device Research Conference, 2022
Defects Motion as the Key Source of Random Telegraph Noise Instability in Hafnium Oxide.
Proceedings of the 52nd IEEE European Solid-State Device Research Conference, 2022
2021
Optimized Synthesis Method for Ultra-Low Power Multi-Input Material Implication Logic With Emerging Non-Volatile Memories.
IEEE Trans. Circuits Syst. I Regul. Pap., 2021
Low-Bit Precision Neural Network Architecture with High Immunity to Variability and Random Telegraph Noise based on Resistive Memories.
Proceedings of the IEEE International Reliability Physics Symposium, 2021
2020
Reconfigurable Smart In-Memory Computing Platform Supporting Logic and Binarized Neural Networks for Low-Power Edge Devices.
IEEE J. Emerg. Sel. Topics Circuits Syst., 2020
Circuit Reliability Analysis of RRAM-based Logic-in-Memory Crossbar Architectures Including Line Parasitic Effects, Variability, and Random Telegraph Noise.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
Trap Dynamics Model Explaining the RON Stress/Recovery Behavior in Carbon-Doped Power AlGaN/GaN MOS-HEMTs.
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
Proceedings of the 2nd IEEE International Conference on Artificial Intelligence Circuits and Systems, 2020
2019
SIMPLY: Design of a RRAM-Based Smart Logic-in-Memory Architecture using RRAM Compact Model.
Proceedings of the 49th European Solid-State Device Research Conference, 2019
2018
Energy-Efficient Logic-in-Memory I-bit Full Adder Enabled by a Physics-Based RRAM Compact Model.
Proceedings of the 48th European Solid-State Device Research Conference, 2018
2017
Variability and sensitivity to process parameters variations in InGaAs dual-gate ultra-thin body MOSFETs: A scaling perspective.
Proceedings of the 27th International Symposium on Power and Timing Modeling, 2017
Measuring and analyzing Random Telegraph Noise in Nanoscale Devices: The case of resistive random access memories.
Proceedings of the 17th Non-Volatile Memory Technology Symposium, 2017
A new verilog-A compact model of random telegraph noise in oxide-based RRAM for advanced circuit design.
Proceedings of the 47th European Solid-State Device Research Conference, 2017
2016
IEEE Trans. Instrum. Meas., 2016
Bipolar Resistive RAM Based on HfO<sub>2</sub>: Physics, Compact Modeling, and Variability Control.
IEEE J. Emerg. Sel. Topics Circuits Syst., 2016
Multiscale modeling of electron-ion interactions for engineering novel electronic devices and materials.
Proceedings of the 26th International Workshop on Power and Timing Modeling, 2016
Probing defects generation during stress in high-κ/metal gate FinFETs by random telegraph noise characterization.
Proceedings of the 46th European Solid-State Device Research Conference, 2016
2015
Proceedings of the IEEE International Reliability Physics Symposium, 2015
Characterization of anomalous Random Telegraph Noise in Resistive Random Access Memory.
Proceedings of the 45th European Solid State Device Research Conference, 2015
2014
Proceedings of the 44th European Solid State Device Research Conference, 2014
2013
Proceedings of 2013 International Conference on IC Design & Technology, 2013
Random telegraph noise analysis to investigate the properties of active traps of HfO2-based RRAM in HRS.
Proceedings of the European Solid-State Device Research Conference, 2013
2012
Proceedings of the 2012 European Solid-State Device Research Conference, 2012