Francesco Lorenzelli

According to our database, Francesco Lorenzelli authored at least 7 papers between 2021 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

Test and Repair Improvements for UCIe.

Tsung-Hsuan Wang, Po-Yao Chuang, Francesco Lorenzelli, Erik Jan Marinissen

Proceedings of the IEEE European Test Symposium, 2024

2023

Effective and Efficient Testing of Large Numbers of Inter-Die Interconnects in Chiplet-Based Multi-Die Packages.

Po-Yao Chuang, Francesco Lorenzelli, Sreejit Chakravarty, Cheng-Wen Wu, Georges G. E. Gielen, Erik Jan Marinissen

Proceedings of the 41st IEEE VLSI Test Symposium, 2023

Wafer-Scale Electrical Characterization of Silicon Quantum Dots from Room to Low Temperatures.

Francesco Lorenzelli, Asser Elsayed, Clement Godfrin, Alexander Grill, Stefan Kubicek, Ruoyu Li, Michele Stucchi, Danny Wan, Kristiaan De Greve, Erik Jan Marinissen, Georges G. E. Gielen

Proceedings of the IEEE International Test Conference, 2023

Generating Test Patterns for Chiplet Interconnects: Achieving Optimal Effectiveness and Efficiency.

Po-Yao Chuang, Francesco Lorenzelli, Erik Jan Marinissen

Proceedings of the IEEE International Test Conference in Asia, 2023

Study of Transistor Metrics for Room-Temperature Screening of Single Electron Transistors for Silicon Spin Qubit Applications.

Francesco Lorenzelli, Asser Elsayed, Clement Godfrin, Alexander Grill, Stefan Kubicek, Ruoyu Li, Michele Stucchi, Danny Wan, Kristiaan De Greve, Erik Jan Marinissen, Georges G. E. Gielen

Proceedings of the IEEE European Test Symposium, 2023

Effective and Efficient Test and Diagnosis Pattern Generation for Many Inter-Die Interconnects in Chiplet-Based Packages.

Po-Yao Chuang, Francesco Lorenzelli, Sreejit Chakravarty, Slimane Boutobza, Cheng-Wen Wu, Georges G. E. Gielen, Erik Jan Marinissen

Proceedings of the IEEE International 3D Systems Integration Conference, 2023

2021

Speeding up Cell-Aware Library Characterization by Preceding Simulation with Structural Analysis.

Francesco Lorenzelli, Zhan Gao, Joe Swenton, Santosh Malagi, Erik Jan Marinissen

Proceedings of the 26th IEEE European Test Symposium, 2021