Francesco Angione

According to our database, Francesco Angione authored at least 11 papers between 2022 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

Optimizing System-Level Test Program Generation via Genetic Programming.

Denis Schwachhofer, Francesco Angione, Steffen Becker, Stefan Wagner, Matthias Sauer, Paolo Bernardi, Ilia Polian

Proceedings of the IEEE European Test Symposium, 2024

A Flexible FPGA-Based Test Equipment for Enabling Out-of-Production Manufacturing Test Flow of Digital Systems.

Nicola Di Gruttola Giardino, Francesco Angione, Paolo Bernardi, Tommaso Foscale, Claudia Bertani, Vincenzo Tancorre

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2024

2023

A Low-Cost Burn-In Tester Architecture to Supply Effective Electrical Stress.

Francesco Angione, Davide Appello, Paolo Bernardi, Claudia Bertani, Giovambattista Gallo, Stefano Littardi, Giorgio Pollaccia, Walter Ruggeri, Matteo Sonza Reorda, Vincenzo Tancorre, Roberto Ugioli

IEEE Trans. Computers, May, 2023

A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips.

Francesco Angione, Davide Appello, Paolo Bernardi, Andrea Calabrese, Stefano Quer, Matteo Sonza Reorda, Vincenzo Tancorre, Roberto Ugioli

IEEE Access, 2023

A guided debugger-based fault injection methodology for assessing functional test programs.

Francesco Angione, Paolo Bernardi, Nicola Di Gruttola Giardino, Davide Appello, Claudia Bertani, Vincenzo Tancorre

Proceedings of the 41st IEEE VLSI Test Symposium, 2023

On the integration and hardening of Software Test Libraries in Real-Time Operating Systems.

Francesco Angione, Paolo Bernardi, Riccardo Cantoro, Nicola Di Gruttola Giardino, Davide Piumatti, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre

Proceedings of the 24th IEEE Latin American Test Symposium, 2023

2022

A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip.

Giusy Iaria, Francesco Angione, Paolo Bernardi, Matteo Sonza Reorda, Davide Appello, Giuseppe Garozzo, Vincenzo Tancorre

Proceedings of the 23rd IEEE Latin American Test Symposium, 2022

An innovative Strategy to Quickly Grade Functional Test Programs.

Francesco Angione, Paolo Bernardi, Andrea Calabrese, Lorenzo Cardone, A. Niccoletti, Davide Piumatti, Stefano Quer, Davide Appello, Vincenzo Tancorre, Roberto Ugioli

Proceedings of the IEEE International Test Conference, 2022

An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip.

Francesco Angione, Paolo Bernardi, Gabriele Filipponi, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli

Proceedings of the IEEE European Test Symposium, 2022

Test, Reliability and Functional Safety Trends for Automotive System-on-Chip.

Francesco Angione, Davide Appello, J. Aribido, Jyotika Athavale, Nicolò Bellarmino, Paolo Bernardi, Riccardo Cantoro, Corrado De Sio, Tommaso Foscale, Gabriele Gavarini, J. Guerrero, Martin Huch, Giusy Iaria, Tobias Kilian, Riccardo Mariani, Raffaele Martone, Annachiara Ruospo, Ernesto Sánchez, Ulf Schlichtmann, Giovanni Squillero, Matteo Sonza Reorda, Luca Sterpone, Vincenzo Tancorre, Roberto Ugioli

Proceedings of the IEEE European Test Symposium, 2022

Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level.

Francesco Angione, Paolo Bernardi, Gabriele Filipponi, Claudia Tempesta, Matteo Sonza Reorda, Davide Appello, Vincenzo Tancorre, Roberto Ugioli

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2022