Foisal Ahmed

According to our database, Foisal Ahmed authored at least 11 papers between 2019 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of three.

2023

Unsupervised Recycled FPGA Detection Using Symmetry Analysis.

Tanvir Ahmad Tarique, Foisal Ahmed, Maksim Jenihhin, Liakot Ali

CoRR, 2023

Holistic IJTAG-based External and Internal Fault Monitoring in UAVs.

Foisal Ahmed, Maksim Jenihhin

Proceedings of the 24th IEEE Latin American Test Symposium, 2023

2022

A Survey on UAV Computing Platforms: A Hardware Reliability Perspective.

Foisal Ahmed, Maksim Jenihhin

Sensors, 2022

Systematic Unsupervised Recycled Field-Programmable Gate Array Detection.

Yuya Isaka, Michihiro Shintani, Foisal Ahmed, Michiko Inoue

CoRR, 2022

On BTI Aging Rejuvenation in Memory Address Decoders.

Cemil Cem Gürsoy, Daniel Kraak, Foisal Ahmed, Mottaqiallah Taouil, Maksim Jenihhin, Said Hamdioui

Proceedings of the 23rd IEEE Latin American Test Symposium, 2022

2021

Accurate Recycled FPGA Detection Using an Exhaustive-Fingerprinting Technique Assisted by WID Process Variation Modeling.

Foisal Ahmed, Michihiro Shintani, Michiko Inoue

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021

Study on High-Accuracy and Low-Cost Recycled FPGA Detection.

Foisal Ahmed, Michihiro Shintani, Michiko Inoue

Proceedings of the IEEE International Test Conference, 2021

Unsupervised Recycled FPGA Detection Based on Direct Density Ratio Estimation.

Yuya Isaka, Foisal Ahmed, Michihiro Shintani, Michiko Inoue

Proceedings of the 27th IEEE International Symposium on On-Line Testing and Robust System Design, 2021

2020

Cost-Efficient Recycled FPGA Detection through Statistical Performance Characterization Framework.

Foisal Ahmed, Michihiro Shintani, Michiko Inoue

IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2020

2019

Low Cost Recycled FPGA Detection Using Virtual Probe Technique.

Foisal Ahmed, Michihiro Shintani, Michiko Inoue

Proceedings of the IEEE International Test Conference in Asia, 2019

Feature Engineering for Recycled FPGA Detection Based on WID Variation Modeling.

Foisal Ahmed, Michihiro Shintani, Michiko Inoue

Proceedings of the 24th IEEE European Test Symposium, 2019