Florian Klemme
Orcid: 0000-0002-0148-0523
According to our database1,
Florian Klemme
authored at least 28 papers
between 2020 and 2024.
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Bibliography
2024
IEEE Trans. Computers, February, 2024
Proceedings of the 25th IEEE Latin American Test Symposium, 2024
Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2024
On the Severity of Self-Heating in FDSOI at Cryogenic Temperatures: In-depth Analysis from Transistors to Full Processor.
Proceedings of the IEEE International Reliability Physics Symposium, 2024
Machine Learning Unleashes Aging and Self-Heating Effects: From Transistors to Full Processor (Invited Paper).
Proceedings of the IEEE International Reliability Physics Symposium, 2024
Proceedings of the IEEE European Test Symposium, 2024
2023
IEEE Trans. Circuits Syst. I Regul. Pap., December, 2023
SyncTREE: Fast Timing Analysis for Integrated Circuit Design through a Physics-informed Tree-based Graph Neural Network.
Proceedings of the Advances in Neural Information Processing Systems 36: Annual Conference on Neural Information Processing Systems 2023, 2023
Proceedings of the IEEE International Test Conference, 2023
Challenges in Machine Learning Techniques to Estimate Reliability from Transistors to Circuits.
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2023
Learning-Oriented Reliability Improvement of Computing Systems From Transistor to Application Level.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023
Robust Resistive Open Defect Identification Using Machine Learning with Efficient Feature Selection.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023
Upheaving Self-Heating Effects from Transistor to Circuit Level using Conventional EDA Tool Flows.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2023
Proceedings of the 60th ACM/IEEE Design Automation Conference, 2023
ML to the Rescue: Reliability Estimation from Self-Heating and Aging in Transistors All the Way up Processors.
Proceedings of the 28th Asia and South Pacific Design Automation Conference, 2023
2022
Efficient Learning Strategies for Machine Learning-Based Characterization of Aging-Aware Cell Libraries.
IEEE Trans. Circuits Syst. I Regul. Pap., 2022
Scalable Machine Learning to Estimate the Impact of Aging on Circuits Under Workload Dependency.
IEEE Trans. Circuits Syst. I Regul. Pap., 2022
IEEE Trans. Circuits Syst. I Regul. Pap., 2022
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022
Impact of NCFET Technology on Eliminating the Cooling Cost and Boosting the Efficiency of Google TPU.
IEEE Trans. Computers, 2022
Proceedings of the IEEE European Test Symposium, 2022
Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition, 2022
Design Close to the Edge for Advanced Technology using Machine Learning and Brain-Inspired Algorithms.
Proceedings of the 27th Asia and South Pacific Design Automation Conference, 2022
2021
IEEE Trans. Circuits Syst. I Regul. Pap., 2021
Proceedings of the IEEE International Test Conference, 2021
2020
Impact of Variability on Processor Performance in Negative Capacitance FinFET Technology.
IEEE Trans. Circuits Syst. I Regul. Pap., 2020
Proceedings of the IEEE/ACM International Conference On Computer Aided Design, 2020
Cell Library Characterization using Machine Learning for Design Technology Co-Optimization.
Proceedings of the IEEE/ACM International Conference On Computer Aided Design, 2020