Fidel Muradali

According to our database, Fidel Muradali authored at least 19 papers between 1990 and 2008.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2008

Load-Board/PCB Noise Suppression via Electromagnetic Band Gap Power Plane Patterning.

Fidel Muradali, Suzanne Huh, Madhavan Swaminathan

Proceedings of the 17th IEEE Asian Test Symposium, 2008

2007

Test Roles in Diagnosis and Silicon Debug.

Anis Uzzaman, Fidel Muradali, Takashi Aikyo, Robert C. Aitken, Tom Jackson, Rajesh Galivanche, Takeshi Onodera

Proceedings of the 16th Asian Test Symposium, 2007

Special Session: Analog Production Test.

Fidel Muradali, Jochen Rivoir

Proceedings of the 16th Asian Test Symposium, 2007

2006

Practical Needs and Wants for Silicon Debug and Diagnosis.

Fidel Muradali

Proceedings of the 15th Asian Test Symposium, 2006

2005

Business constraints drive test decisions.

Fidel Muradali

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

2004

ITC 2003 panels: Part 2.

Carol Stolicny, Mustapha Slamani, Fidel Muradali, Geir Eide, Mike Li

IEEE Des. Test Comput., 2004

From Working Design Flow to Working Chips: Dependencies and Impacts of Methodology Decisions.

Robert C. Aitken, Fidel Muradali

Proceedings of the 2004 Design, 2004

2003

Diagnosis in Modern Design - Just the Tip of the Iceberg.

Fidel Muradali

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

Future ATE: Perspectives & Requirements.

Fidel Muradali

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

Analog and Mixed Signal BIST: Too Much, Too Little, Too Late?

Adam Osseiran, William De Wilkins, Barry Baril, Sassan Tabatabaei, Fidel Muradali, Ken Posse, Lee Song

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

Reducing Time to Volume and Time to Market: Is Silicon Debug and Diagnosis the Answer?

Fidel Muradali, Mike Ricchetti, Bart Vermeulen, Bulent I. Dervisoglu, Bob Gottlieb, Bernd Koenemann, C. J. Clark

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

The Impact of Outsourcing on Test.

Fidel Muradali

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

Power supply transient signal integration circuit.

Chintan Patel, Fidel Muradali, James F. Plusquellic

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001

2000

Do I Need this Tool for My Chips to Work?

Fidel Muradali, André Ivanov

Proceedings of the 18th IEEE VLSI Test Symposium (VTS 2000), 30 April, 2000

1999

Defect detection using power supply transient signal analysis.

Amy Germida, Zheng Yan, James F. Plusquellic, Fidel Muradali

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

Trends in SLI design and their effect on test.

Robert C. Aitken, Fidel Muradali

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1996

A self-driven test structure for pseudorandom testing of non-scan sequential circuits.

Fidel Muradali, Janusz Rajski

Proceedings of the 14th IEEE VLSI Test Symposium (VTS'96), April 28, 1996

1995

A structure and technique for pseudorandom-based testing of sequential circuits.

Fidel Muradali, Takao Nishida, Tsuguo Shimizu

J. Electron. Test., 1995

1990

A new procedure for weighted random built-in self-test.

Fidel Muradali, Vinod K. Agarwal, Benoit Nadeau-Dostie

Proceedings of the Proceedings IEEE International Test Conference 1990, 1990