Fernando L. Aguirre

According to our database, Fernando L. Aguirre authored at least 8 papers between 2018 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

Skyrmion-based Leaky Integrate and Fire Neurons for Neuromorphic Applications.

Aijaz H. Lone, Selma Amara, Fernando L. Aguirre, Mario Lanza, Hossein Fariborzi

CoRR, 2022

Memristors with Initial Low-Resistive State for Efficient Neuromorphic Systems.

Kaichen Zhu, Mohammad Reza Mahmoodi, Zahra Fahimi, Yiping Xiao, Tao Wang, Kristýna Bukvisová, Miroslav Kolíbal, Juan Bautista Roldán, David Perez, Fernando L. Aguirre, Mario Lanza

Adv. Intell. Syst., 2022

2021

Line Resistance Impact in Memristor-based Multi Layer Perceptron for Pattern Recognition.

Fernando L. Aguirre, Sebastián Matías Pazos, Felix Palumbo, N. Gomez, Enrique Miranda, Jordi Suñé

Proceedings of the 12th IEEE Latin America Symposium on Circuits and System, 2021

2020

Application of the Quasi-Static Memdiode Model in Cross-Point Arrays for Large Dataset Pattern Recognition.

Fernando Leonel Aguirre, Sebastián Matías Pazos, Felix Palumbo, Jordi Suñé, Enrique Miranda

IEEE Access, 2020

2019

Spatio-Temporal Defect Generation Process in Irradiated HfO2 MOS Stacks: Correlated Versus Uncorrelated Mechanisms.

Fernando Leonel Aguirre, Andrea Padovani, Alok Ranjan, Nagarajan Raghavan, Nahuel Vega, Nahuel Muller, Sebastián Matías Pazos, Mario Debray, Joel Molina Reyes, Kin Leong Pey, Felix Palumbo

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

Performance-reliability trade-offs in short range RF power amplifier design.

Sebastián Matías Pazos, Fernando L. Aguirre, Felix Palumbo, Fernando Silveira

Microelectron. Reliab., 2018

Heavy Ion Microbeam Experimental Study of ASET on a Full-Custom CMOS OpAmp.

Andrés Fontana, Sebastián Matías Pazos, Fernando L. Aguirre, Felix Palumbo, Nahuel Vega, Nahuel A. Müller, Emanuel de la Fourniere, Mario Debray

Proceedings of the 31st Symposium on Integrated Circuits and Systems Design, 2018

Impact of forming gas annealing on the degradation dynamics of Ge-based MOS stacks.

Fernando L. Aguirre, Sebastián Matías Pazos, Felix Palumbo, Sivan Fadida, Roy Winter, Moshe Eizenberg

Proceedings of the IEEE International Reliability Physics Symposium, 2018