Fernando Guarin

According to our database, Fernando Guarin authored at least 19 papers between 2013 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

RF long term aging behavior and reliability in 22FDX WiFi Power Amplifier designs for 5G applications.

P. Srinivasan, J. Lestage, Shafi Syed, X. Hui, Stephen Moss, Oscar D. Restrepo, Oscar H. Gonzalez, Y. Chen, T. McKay, Anirban Bandyopadhyay, Ned Cahoon, Fernando Guarin, Byoung Min, Martin Gall, S. Ludvik

Proceedings of the IEEE International Reliability Physics Symposium, 2023

Reliability of SPST Series-stacked SOI CMOS RF Switches for mmWave Applications.

Aarti Rathi, Abhisek Dixit, Naga Satish, P. Srinivasan, Fernando Guarin

Proceedings of the IEEE International Reliability Physics Symposium, 2023

Impact of Non-Conducting HCI Degradation on Small-Signal Parameters in RF SOI MOSFET.

Dora A. Chaparro-Ortiz, Alan Y. Otero-Carrascal, Edmundo A. Gutiérrez-D., Reydezel Torres-Torres, Oscar Huerta-Guevara, P. Srinivasan, Fernando Guarin

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022

Excellent RF Product HTOL reliability of 5G mmWave beamformer chip fabricated using GF 45RFSOI technologies.

P. Srinivasan, Fernando Guarin, Enkhbayasgalan Gantsog, Harish Krishnaswamy, Arun Natarajan

Proceedings of the IEEE International Reliability Physics Symposium, 2022

RF Reliability of CMOS-Based Power Amplifier Cell for 5G mmWave Applications.

Aarti Rathi, Abhisek Dixit, P. Srinivasan, Oscar Huerta-Gonzalez, Fernando Guarin

Proceedings of the IEEE International Reliability Physics Symposium, 2022

Parasitic Drain Series Resistance Effects on Non-conducting Hot Carrier Reliability.

M. Hauser, P. Srinivasan, A. Vallett, R. Krishnasamy, Fernando Guarin, Dave Brochu, V. Pham, Byoung Min

Proceedings of the IEEE International Reliability Physics Symposium, 2022

6G Roadmap for Semiconductor Technologies: Challenges and Advances.

Ned Cahoon, P. Srinivasan, Fernando Guarin

Proceedings of the IEEE International Reliability Physics Symposium, 2022

Deep Cryogenic Temperature TDDB in 45-nm PDSOI N-channel FETs for Quantum Computing Applications.

Asifa Amin, Aarti Rathi, Sujit K. Singh, Abhisek Dixit, Oscar Huerta-Gonzalez, P. Srinivasan, Fernando Guarin

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021

RF Reliability of SOI-based Power Amplifier FETs for mmWave 5G Applications.

P. Srinivasan, Fernando Guarin, Shafi Syed, Joris Angelo Sundaram Jerome, Wen Liu, Sameer H. Jain, Dimitri Lederer, Stephen Moss, Paul Colestock, Anirban Bandyopadhyay, Ned Cahoon, Byoung Min, Martin Gall

Proceedings of the IEEE International Reliability Physics Symposium, 2021

CMOS RF reliability for 5G mmWave applications - Challenges and Opportunities.

P. Srinivasan, Fernando Guarin

Proceedings of the IEEE International Reliability Physics Symposium, 2021

Large Signal RF Reliability of 45-nm RFSOI Power Amplifier Cell for Wi-Fi6 Applications.

Aarti Rathi, P. Srinivasan, Fernando Guarin, Abhisek Dixit

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020

Self-heating characterization and its applications in technology development.

Peter C. Paliwoda, Maria Toledano-Luque, Tanya Nigam, Fernando Guarin, M. Nour, S. Cimino, L. Pantisano, A. Gupta, Oscar Huerta-Gonzalez, M. Hauser, W. Liu, A. Vayshenker, D. Ioannou, D. Lee, L. Jiang, P. Yee, Stewart E. Rauch, B. Min

Proceedings of the 29th IEEE North Atlantic Test Workshop, 2020

A novel methodology to evaluate RF reliability for SOI CMOS-based Power Amplifier mmWave applications.

P. Srinivasan, Paul Colestock, Thomas Samuels, Stephen Moss, Fernando Guarin, Byoung Min

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Thermal Characterization and TCAD Modeling of a Power Amplifier in 45RFSOI for 5G mmWave Applications.

Peter C. Paliwoda, Mohamed A. Rabie, Oscar D. Restrepo, Eduardo Cruz Silva, E. Kaltalioglu, Fernando Guarin, Kenneth Barnett, Jeffrey B. Johnson, William Taylor, Myra Boenke, Byoung Min

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Silicon Based RF Reliability Challenges for 5G Communications.

Paul Colestock, P. Srinivasan, Fernando Guarin

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2018

Cap layer and multi-work-function tuning impact on TDDB/BTI in SOI FinFET devices.

Wen Liu, Andreas Kerber, Fernando Guarin, Claude Ortolland

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2015

Self-heating and its implications on hot carrier reliability evaluations.

Steven W. Mittl, Fernando Guarin

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2014

Non-homogeneous space mechanical strain induces asymmetrical magneto-tunneling conductance in MOSFETs.

A. Erika Pondigo de los, Edmundo A. Gutiérrez-D., Joel Molina Reyes, Fernando Guarin

Proceedings of the 44th European Solid State Device Research Conference, 2014

2013

A negative differential resistance effect implemented with a single MOSFET from 375 k down to 80 k.

Victor Vega-Gonzalez, Edmundo Gutierrez-Dominguez, Fernando Guarin

Proceedings of the European Solid-State Device Research Conference, 2013