Fengchao Zhang

According to our database, Fengchao Zhang authored at least 9 papers between 2015 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

RIHANN: Remote IoT Hardware Authentication With Intrinsic Identifiers.

Shubhra Deb Paul, Fengchao Zhang, Patanjali SLPSK, Amit Ranjan Trivedi, Swarup Bhunia

IEEE Internet Things J., 2022

2021

On Database-Free Authentication of Microelectronic Components.

Fengchao Zhang, Shubhra Deb Paul, Patanjali SLPSK, Amit Ranjan Trivedi, Swarup Bhunia

IEEE Trans. Very Large Scale Integr. Syst., 2021

2018

Multi-Mode Micromechanical Resonant Tags for Traceability and Authentication Applications.

Angela R. Newsome, Mehrdad Ramezani, Mayur Ghatge, Fengchao Zhang, Swarup Bhunia, Roozbeh Tabrizian

Proceedings of the 13th IEEE Annual International Conference on Nano/Micro Engineered and Molecular Systems, 2018

2017

Authentication and traceability of food products through the supply chain using NQR spectroscopy.

Fengchao Zhang, Naren Vikram Raj Masna, Swarup Bhunia, Cheng Chen, Soumyajit Mandal

Proceedings of the IEEE Biomedical Circuits and Systems Conference, 2017

2016

DScanPUF: A Delay-Based Physical Unclonable Function Built Into Scan Chain.

Yu Zheng, Fengchao Zhang, Swarup Bhunia

IEEE Trans. Very Large Scale Integr. Syst., 2016

Authentication of Medicines Using Nuclear Quadrupole Resonance Spectroscopy.

Cheng Chen, Fengchao Zhang, Jamie Barras, Kaspar Althoefer, Swarup Bhunia, Soumyajit Mandal

IEEE ACM Trans. Comput. Biol. Bioinform., 2016

Current based PUF exploiting random variations in SRAM cells.

Fengchao Zhang, Shuo Yang, Jim Plusquellic, Swarup Bhunia

Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition, 2016

2015

Robust counterfeit PCB detection exploiting intrinsic trace impedance variations.

Fengchao Zhang, Andrew Hennessy, Swarup Bhunia

Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

PiRA: IC authentication utilizing intrinsic variations in pin resistance.

Abhishek Basak, Fengchao Zhang, Swarup Bhunia

Proceedings of the 2015 IEEE International Test Conference, 2015