Feng Shi

According to our database, Feng Shi authored at least 12 papers between 2004 and 2009.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2009

Soft-Error Tolerance and Mitigation in Asynchronous Burst-Mode Circuits.

Sobeeh Almukhaizim, Feng Shi, Eric Love, Yiorgos Makris

IEEE Trans. Very Large Scale Integr. Syst., 2009

Enhancing Simulation Accuracy through Advanced Hazard Detection in Asynchronous Circuits.

Feng Shi, Yiorgos Makris

IEEE Trans. Computers, 2009

2008

Coping with Soft Errors in Asynchronous Burst-Mode Machines.

Sobeeh Almukhaizim, Feng Shi, Yiorgos Makris

Proceedings of the 14th IEEE International Symposium on Asynchronous Circuits and Systems, 2008

2006

Testing delay faults in asynchronous handshake circuits.

Feng Shi, Yiorgos Makris

Proceedings of the 2006 International Conference on Computer-Aided Design, 2006

A Transistor-Level Test Strategy for C^2MOS MOUSETRAP Asynchronous Pipelines.

Feng Shi, Yiorgos Makris

Proceedings of the 12th IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC 2006), 2006

Low-Overhead Testing of Delay Faults in High-Speed Asynchronous Pipelines.

Gennette Gill, Ankur Agiwal, Montek Singh, Feng Shi, Yiorgos Makris

Proceedings of the 12th IEEE International Symposium on Asynchronous Circuits and Systems (ASYNC 2006), 2006

2005

Test generation for ultra-high-speed asynchronous pipelines.

Feng Shi, Yiorgos Makris, Steven M. Nowick, Montek Singh

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

SPIN-PAC: test compaction for speed-independent circuits.

Feng Shi, Yiorgos Makris

Proceedings of the 2005 Conference on Asia South Pacific Design Automation, 2005

2004

SPIN-SIM: Logic and Fault Simulation for Speed-Independent Circuits.

Feng Shi, Yiorgos Makris

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

Compiler-Based Frame Formation for Static Optimization.

Feng Shi, Sobeeh Almukhaizim, Pey-Chang Lin, Yiorgos Makris

Proceedings of the 22nd IEEE International Conference on Computer Design: VLSI in Computers & Processors (ICCD 2004), 2004

SPIN-TEST: automatic test pattern generation for speed-independent circuits.

Feng Shi, Yiorgos Makris

Proceedings of the 2004 International Conference on Computer-Aided Design, 2004

Fault simulation and random test generation for speed-independent circuits.

Feng Shi, Yiorgos Makris

Proceedings of the 14th ACM Great Lakes Symposium on VLSI 2004, 2004