Felix Beaudoin

According to our database, Felix Beaudoin authored at least 32 papers between 2001 and 2007.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2007

Dynamic laser stimulation techniques for advanced failure analysis and design debug applications.

Felix Beaudoin, Kevin Sanchez, Philippe Perdu

Microelectron. Reliab., 2007

2006

Application of various optical techniques for ESD defect localization.

Fabien Essely, Frédéric Darracq, Vincent Pouget, Mustapha Remmach, Felix Beaudoin, Nicolas Guitard, Marise Bafleur, Philippe Perdu, André Touboul, Dean Lewis

Microelectron. Reliab., 2006

2005

NIR laser stimulation for dynamic timing analysis.

Kevin Sanchez, Romain Desplats, Felix Beaudoin, Philippe Perdu, J. P. Roux, G. Woods, Dean Lewis

Microelectron. Reliab., 2005

Oxide charge measurements in EEPROM devices.

C. De Nardi, Romain Desplats, Philippe Perdu, Felix Beaudoin, J.-L. Gauffier

Microelectron. Reliab., 2005

Impact of semiconductors material on IR Laser Stimulation signal.

Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat

Microelectron. Reliab., 2005

Failure analysis of micro-heating elements suspended on thin membranes.

Danick Briand, Felix Beaudoin, Jérôme Courbat, Nico F. de Rooij, Romain Desplats, Philippe Perdu

Microelectron. Reliab., 2005

Dynamic Laser Stimulation Case Studies.

Felix Beaudoin, Kevin Sanchez, Romain Desplats, Philippe Perdu, Jean Marc Nicot, J. P. Roux, M. Otte

Microelectron. Reliab., 2005

2004

Understanding the effects of NIR laser stimulation on NMOS transistor.

Abdellatif Firiti, Felix Beaudoin, Gérald Haller, Philippe Perdu, Dean Lewis, Pascal Fouillat

Microelectron. Reliab., 2004

Time Resolved Photon Emission Processing Flow for IC Analysis.

Romain Desplats, Gaël Faggion, Mustapha Remmach, Felix Beaudoin, Philippe Perdu, Dean Lewis

Microelectron. Reliab., 2004

Femtosecond Laser Ablation for Backside Silicon Thinning.

Felix Beaudoin, J. López, M. Faucon, Romain Desplats, Philippe Perdu

Microelectron. Reliab., 2004

2003

TCAD and SPICE modeling help solve ESD protection issues in analog CMOS technology.

David Trémouilles, Géraldine Bertrand, Marise Bafleur, Felix Beaudoin, Philippe Perdu, Nicolas Guitard, Lionel Lescouzères

Microelectron. Reliab., 2003

Solar Cell Analysis with Light Emission and OBIC Techniques.

Kevin Sanchez, Romain Desplats, Guy Perez, V. Pichetto, Felix Beaudoin, Philippe Perdu

Microelectron. Reliab., 2003

Time Resolved Photoemission (PICA) - From the Physics to Practical Considerations.

Mustapha Remmach, Romain Desplats, Felix Beaudoin, E. Frances, Philippe Perdu, Dean Lewis

Microelectron. Reliab., 2003

The advent of MEMS in space.

Xavier Lafontan, Francis Pressecq, Felix Beaudoin, Sebastien Rigo, M. Dardalhon, J.-L. Roux, Petra Schmitt, J. Kuchenbecker, B. Baradat, Djemel Lellouchi

Microelectron. Reliab., 2003

Short defect characterization based on TCR parameter extraction.

Abdellatif Firiti, D. Faujour, Gérald Haller, J. M. Moragues, Vincent Goubier, Philippe Perdu, Felix Beaudoin, Dean Lewis

Microelectron. Reliab., 2003

Faster IC Analysis with PICA Spatial Temporal Photon Correlation and CAD Autochanneling.

Romain Desplats, A. Eral, Felix Beaudoin, Philippe Perdu, Alan J. Weger, Moyra K. McManus, Peilin Song, Franco Stellari

Microelectron. Reliab., 2003

Magnetic emission mapping for passive integrated components characterisation.

Olivier Crépel, Romain Desplats, Y. Bouttement, Philippe Perdu, C. Goupil, Philippe Descamps, Felix Beaudoin, L. Marina

Microelectron. Reliab., 2003

From Static Thermal and Photoelectric Laser Stimulation (TLS/PLS) to Dynamic Laser Testing.

Felix Beaudoin, Romain Desplats, Philippe Perdu, Abdellatif Firiti, Gérald Haller, Vincent Pouget, Dean Lewis

Microelectron. Reliab., 2003

A physical approach on SCOBIC investigation in VLSI.

Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Philippe Perdu, Pascal Fouillat, Yves Danto

Microelectron. Reliab., 2003

Thermal laser stimulation and NB-OBIC techniques applied to ESD defect localization.

Thomas Beauchêne, Dean Lewis, Felix Beaudoin, Vincent Pouget, Romain Desplats, Pascal Fouillat, Philippe Perdu, Marise Bafleur, David Trémouilles

Microelectron. Reliab., 2003

Fault Localization using Time Resolved Photon Emission and STIL Waveforms.

Romain Desplats, Felix Beaudoin, Philippe Perdu, Nagamani Nataraj, Ted R. Lundquist, Ketan Shah

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

IR confocal laser microscopy for MEMS Technological Evaluation.

Djemel Lellouchi, Felix Beaudoin, Christophe Le Touze, Philippe Perdu, Romain Desplats

Microelectron. Reliab., 2002

Comprehensive failure analysis of leakage faults in bipolar transistors.

Bernadette Domengès, P. Schwindenhammer, Patrick Poirier, Felix Beaudoin, Philippe Descamps

Microelectron. Reliab., 2002

Backside Hot Spot Detection Using Liquid Crystal Microscopy.

Olivier Crépel, Felix Beaudoin, Lionel Dantas de Morais, Gérald Haller, C. Goupil, Philippe Perdu, Romain Desplats, Dean Lewis

Microelectron. Reliab., 2002

Reliability Defect Monitoring with Thermal Laser Stimulation: Biased Versus Unbiased.

Felix Beaudoin, Gérald Haller, Philippe Perdu, Romain Desplats, Thomas Beauchêne, Dean Lewis

Microelectron. Reliab., 2002

Backside Defect Localizations and Revelations Techniques on Gallium Arsenide (GaAs) Devices.

Felix Beaudoin, D. Carisetti, Romain Desplats, Philippe Perdu, Dean Lewis, J. C. Clement

Microelectron. Reliab., 2002

A 2.5 Gbit/s CMOS optical receiver frontend.

Patrick Mitran, Felix Beaudoin, Mourad N. El-Gamal

Proceedings of the 2002 International Symposium on Circuits and Systems, 2002

2001

Front Side and Backside OBIT Mappings applied to Single Event Transient Testing.

Dean Lewis, Vincent Pouget, Thomas Beauchêne, Hervé Lapuyade, Pascal Fouillat, André Touboul, Felix Beaudoin, Philippe Perdu

Microelectron. Reliab., 2001

A New Versatile Testing Interface for Failure Analysis in Integrated Circuits.

Romain Desplats, Philippe Perdu, Felix Beaudoin

Microelectron. Reliab., 2001

Backside Localization of Current Leakage Faults Using Thermal Laser Stimulation.

Romain Desplats, Felix Beaudoin, Philippe Perdu, Patrick Poirier, David Trémouilles, Marise Bafleur, Dean Lewis

Microelectron. Reliab., 2001

Silicon Thinning and Polishing on Packaged Devices.

Felix Beaudoin, Philippe Perdu, Romain Desplats, Sebastien Rigo, Dean Lewis

Microelectron. Reliab., 2001

Modeling Thermal Laser Stimulation.

Felix Beaudoin, X. Chauffleur, Jean-Pierre Fradin, Philippe Perdu, Romain Desplats, Dean Lewis

Microelectron. Reliab., 2001