Federico Venini

According to our database, Federico Venini authored at least 8 papers between 2016 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2018

An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In.

Davide Appello, Paolo Bernardi, Conrad Bugeja, Riccardo Cantoro, Andrea Colazzo, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, Marco Restifo, Ernesto Sánchez, Federico Venini

J. Low Power Electron., 2018

Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoC.

Davide Appello, Paolo Bernardi, Conrad Bugeja, Riccardo Cantoro, Giorgio Pollaccia, Marco Restifo, Federico Venini

J. Electron. Test., 2018

An Optimized Test During Burn-In for Automotive SoC.

Davide Appello, Conrad Bugeja, Giorgio Pollaccia, Paolo Bernardi, Riccardo Cantoro, Marco Restifo, Ernesto Sánchez, Federico Venini

IEEE Des. Test, 2018

2017

A DMA and CACHE-based stress schema for burn-in of automotive microcontroller.

Paolo Bernardi, Riccardo Cantoro, L. Gianotto, Marco Restifo, Ernesto Sánchez, Federico Venini, Davide Appello

Proceedings of the 18th IEEE Latin American Test Symposium, 2017

Robustness in automotive electronics: An industrial overview of major concerns.

Ulrich Backhausen, Oscar Ballan, Paolo Bernardi, Sergio de Luca, Julie Henzler, Thomas Kern, Davide Piumatti, Thomas Rabenalt, Krishnapriya Chakiat Ramamoorthy, Ernesto Sánchez, Alessandro Sansonetti, Rudolf Ullmann, Federico Venini, Robert Wiesner

Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017

A comprehensive methodology for stress procedures evaluation and comparison for Burn-In of automotive SoC.

Davide Appello, Paolo Bernardi, G. Giacopelli, Alessandro Motta, Alberto Pagani, Giorgio Pollaccia, C. Rabbi, Marco Restifo, P. Ruberg, Ernesto Sánchez, C. M. Villa, Federico Venini

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2017

2016

Faster-than-at-speed execution of functional programs: An experimental analysis.

Paolo Bernardi, Alberto Bosio, Giorgio Di Natale, Andrea Guerriero, Federico Venini

Proceedings of the 2016 IFIP/IEEE International Conference on Very Large Scale Integration, 2016

Improving Stress Quality for SoC Using Faster-than-At-Speed Execution of Functional Programs.

Paolo Bernardi, Alberto Bosio, Giorgio Di Natale, Andrea Guerriero, Ernesto Sánchez, Federico Venini

Proceedings of the VLSI-SoC: System-on-Chip in the Nanoscale Era - Design, Verification and Reliability, 2016