Fausto Fantini

According to our database, Fausto Fantini authored at least 16 papers between 1989 and 2013.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2013

Impact of field-plate geometry on the reliability of GaN-on-SiC HEMTs.

Alessandro Chini, Fabio Soci, Fausto Fantini, A. Nanni, A. Pantellini, Claudio Lanzieri, Gaudenzio Meneghesso, Enrico Zanoni

Microelectron. Reliab., 2013

2012

Field plate related reliability improvements in GaN-on-Si HEMTs.

Alessandro Chini, Fabio Soci, Fausto Fantini, Antonio Nanni, Alessio Pantellini, Claudio Lanzieri, Davide Bisi, Gaudenzio Meneghesso, Enrico Zanoni

Microelectron. Reliab., 2012

2010

Experimental and simulated dc degradation of GaN HEMTs by means of gate-drain and gate-source reverse bias stress.

Valerio Di Lecce, Michele Esposto, Matteo Bonaiuti, Gaudenzio Meneghesso, Enrico Zanoni, Fausto Fantini, Alessandro Chini

Microelectron. Reliab., 2010

Analysis of current collapse effect in AlGaN/GaN HEMT: Experiments and numerical simulations.

Mustapha Faqir, Mohsine Bouya, Nathalie Malbert, Nathalie Labat, D. Carisetti, Benoit Lambert, Giovanni Verzellesi, Fausto Fantini

Microelectron. Reliab., 2010

2008

Sulfur-contamination of high power white LED.

Giovanna Mura, G. Cassanelli, Fausto Fantini, Massimo Vanzi

Microelectron. Reliab., 2008

2007

Characterization and analysis of trap-related effects in AlGaN-GaN HEMTs.

Mustapha Faqir, Giovanni Verzellesi, Fausto Fantini, Francesca Danesin, Fabiana Rampazzo, Gaudenzio Meneghesso, Enrico Zanoni, Anna Cavallini, Antonio Castaldini, Nathalie Labat, André Touboul, Christian Dua

Microelectron. Reliab., 2007

2006

Failure Analysis-assisted FMEA.

G. Cassanelli, Giovanna Mura, Fausto Fantini, Massimo Vanzi, Bernard Plano

Microelectron. Reliab., 2006

2005

Reliability predictions in electronic industrial applications.

G. Cassanelli, Giovanna Mura, F. Cesaretti, Massimo Vanzi, Fausto Fantini

Microelectron. Reliab., 2005

2004

Failure Analysis of RuO₂ Thick Film Chip Resistors.

Simona Podda, G. Cassanelli, Fausto Fantini, Massimo Vanzi

Microelectron. Reliab., 2004

2003

High Electric Field Induced Degradation of the DC Characteristics in Si/SiGe HEMT's.

J. Kuchenbecker, Mattia Borgarino, M. Zeuner, U. König, Robert Plana, Fausto Fantini

Microelectron. Reliab., 2003

Reliability in automotive electronics: a case study applied to diesel engine control.

G. Cassanelli, Fausto Fantini, G. Serra, S. Sgatti

Microelectron. Reliab., 2003

2002

Degradation Based Long-Term Reliability Assessment for Electronic Components in Submarine Applications.

V. Lista, P. Garbossa, T. Tomasi, Mattia Borgarino, Fausto Fantini, L. Gherardi, A. Righetti, M. Villa

Microelectron. Reliab., 2002

Editorial.

Fausto Fantini, Massimo Vanzi

Microelectron. Reliab., 2002

2001

Reliability physics of compound semiconductor transistors for microwave applications.

Mattia Borgarino, Roberto Menozzi, Domenico Dieci, Laura Cattani, Fausto Fantini

Microelectron. Reliab., 2001

1990

VLSI reliability: Contributions from a three year national research program.

Giovanni Soncini, Claudio Canali, Enrico Zanoni, Francrsco Cors, Alessandro Diligenti, Fausto Fantini, Vito A. Monaco, Guido Masetti, Carlo Morandi

Eur. Trans. Telecommun., 1990

1989

A Foveated Retina-Like Sensor Using CCD Technology.

Jan Van der Spiegel, G. Kreider, C. Claeys, I. Debusschere, Giulio Sandini, Paolo Dario, Fausto Fantini, P. Bellutti, Giovanni Soncini

Proceedings of the Analog VLSI Implementation of Neural Systems, 1989