Farid N. Najm
Orcid: 0000-0001-5393-7794Affiliations:
- University of Toronto, Canada
According to our database1,
Farid N. Najm
authored at least 147 papers
between 1988 and 2024.
Collaborative distances:
Collaborative distances:
Awards
IEEE Fellow
IEEE Fellow 2003, "For contributions to estimation and modeling of power dissipation in integrated circuits.".
Timeline
Legend:
Book In proceedings Article PhD thesis Dataset OtherLinks
Online presence:
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on orcid.org
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on dl.acm.org
On csauthors.net:
Bibliography
2024
Proceedings of the 25th International Symposium on Quality Electronic Design, 2024
2023
Proceedings of the 24th International Symposium on Quality Electronic Design, 2023
Electromigration Assessment in Power Grids with Account of Redundancy and Non-Uniform Temperature Distribution.
Proceedings of the 2023 International Symposium on Physical Design, 2023
2022
Experimental Validation of a Novel Methodology for Electromigration Assessment in On-Chip Power Grids.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022
2020
Proceedings of the IEEE/ACM International Conference On Computer Aided Design, 2020
2019
IEEE Trans. Very Large Scale Integr. Syst., 2019
Efficient Simulation of Electromigration Damage in Large Chip Power Grids Using Accurate Physical Models (Invited Paper).
Proceedings of the IEEE International Reliability Physics Symposium, 2019
Proceedings of the International Conference on Computer-Aided Design, 2019
2018
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018
2017
ACM Trans. Design Autom. Electr. Syst., 2017
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017
Proceedings of the 2017 IEEE Computer Society Annual Symposium on VLSI, 2017
Proceedings of the 2017 IEEE/ACM International Conference on Computer-Aided Design, 2017
Proceedings of the 2017 IEEE/ACM International Conference on Computer-Aided Design, 2017
Fast physics-based electromigration assessment by efficient solution of linear time-invariant (LTI) systems.
Proceedings of the 2017 IEEE/ACM International Conference on Computer-Aided Design, 2017
2016
Verification of the Power and Ground Grids Under General and Hierarchical Constraints.
IEEE Trans. Very Large Scale Integr. Syst., 2016
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016
Proceedings of the IEEE International Symposium on Circuits and Systems, 2016
Proceedings of the 35th International Conference on Computer-Aided Design, 2016
Proceedings of the 35th International Conference on Computer-Aided Design, 2016
Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition, 2016
Proceedings of the 2016 IEEE Canadian Conference on Electrical and Computer Engineering, 2016
2015
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015
Proceedings of the 2015 Symposium on International Symposium on Physical Design, ISPD 2015, Monterey, CA, USA, March 29, 2015
Proceedings of the 20th Asia and South Pacific Design Automation Conference, 2015
2013
Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2013
Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2013
2012
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012
Efficient Block-Based Parameterized Timing Analysis Covering All Potentially Critical Paths.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012
Proceedings of the 2012 IEEE/ACM International Conference on Computer-Aided Design, 2012
Proceedings of the 49th Annual Design Automation Conference 2012, 2012
2011
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2011
Proceedings of the Design, Automation and Test in Europe, 2011
Proceedings of the 48th Design Automation Conference, 2011
Proceedings of the 48th Design Automation Conference, 2011
Proceedings of the 48th Design Automation Conference, 2011
2010
Verification and Codesign of the Package and Die Power Delivery System Using Wavelets.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2010
Proceedings of the 2010 International Conference on Computer-Aided Design, 2010
Proceedings of the 2010 International Conference on Computer-Aided Design, 2010
Proceedings of the 15th Asia South Pacific Design Automation Conference, 2010
2009
IEEE Trans. Very Large Scale Integr. Syst., 2009
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009
Proceedings of the 2009 International Conference on Computer-Aided Design, 2009
Proceedings of the 2009 International Conference on Computer-Aided Design, 2009
Clock skew optimization via wiresizing for timing sign-off covering all process corners.
Proceedings of the 46th Design Automation Conference, 2009
Proceedings of the 46th Design Automation Conference, 2009
2008
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2008
Early Analysis and Budgeting of Margins and Corners Using Two-Sided Analytical Yield Models.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2008
Parameterized timing analysis with general delay models and arbitrary variation sources.
Proceedings of the 45th Design Automation Conference, 2008
2007
IEEE Trans. Very Large Scale Integr. Syst., 2007
A Yield Model for Integrated Circuits and its Application to Statistical Timing Analysis.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2007
Proceedings of the 2007 International Symposium on Low Power Electronics and Design, 2007
Proceedings of the 2007 International Conference on Computer-Aided Design, 2007
Proceedings of the 2007 Design, Automation and Test in Europe Conference and Exposition, 2007
Modeling and Estimation of Full-Chip Leakage Current Considering Within-Die Correlation.
Proceedings of the 44th Design Automation Conference, 2007
2006
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006
Analysis and verification of power grids considering process-induced leakage-current variations.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006
Proceedings of the 2006 International Conference on Computer-Aided Design, 2006
An adaptive FPGA architecture with process variation compensation and reduced leakage.
Proceedings of the 43rd Design Automation Conference, 2006
Proceedings of the 43rd Design Automation Conference, 2006
A Soft-Error Tolerant Content-Addressable Memory (CAM) Using An Error-Correcting-Match Scheme.
Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, 2006
2005
IEEE Trans. Very Large Scale Integr. Syst., 2005
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2005
Proceedings of the 2005 International Symposium on Low Power Electronics and Design, 2005
Proceedings of the 2005 International Conference on Computer-Aided Design, 2005
Proceedings of the 2005 International Conference on Computer-Aided Design, 2005
Proceedings of the 42nd Design Automation Conference, 2005
Proceedings of the 42nd Design Automation Conference, 2005
Proceedings of the 42nd Design Automation Conference, 2005
Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005
Proceedings of the 2005 Conference on Asia South Pacific Design Automation, 2005
2004
IEEE Trans. Very Large Scale Integr. Syst., 2004
Proceedings of the 5th International Symposium on Quality of Electronic Design (ISQED 2004), 2004
Proceedings of the 2004 International Conference on Computer-Aided Design, 2004
Proceedings of the 2004 International Conference on Computer-Aided Design, 2004
Proceedings of the ACM/SIGDA 12th International Symposium on Field Programmable Gate Arrays, 2004
Proceedings of the 41th Design Automation Conference, 2004
Proceedings of the 41th Design Automation Conference, 2004
Proceedings of the 41th Design Automation Conference, 2004
Proceedings of the IEEE 2004 Custom Integrated Circuits Conference, 2004
Proceedings of the 2004 Conference on Asia South Pacific Design Automation: Electronic Design and Solution Fair 2004, 2004
2003
IEEE Trans. Very Large Scale Integr. Syst., 2003
Proceedings of the 5th International Workshop on System-Level Interconnect Prediction (SLIP 2003), 2003
Proceedings of the 4th International Symposium on Quality of Electronic Design (ISQED 2003), 2003
ESTIMA: an architectural-level power estimator for multi-ported pipelined register files.
Proceedings of the 2003 International Symposium on Low Power Electronics and Design, 2003
Statistical Verification of Power Grids Considering Process-Induced Leakage Current Variations.
Proceedings of the 2003 International Conference on Computer-Aided Design, 2003
Proceedings of the 2003 International Conference on Computer-Aided Design, 2003
A static pattern-independent technique for power grid voltage integrity verification.
Proceedings of the 40th Design Automation Conference, 2003
Statistical estimation of leakage-induced power grid voltage drop considering within-die process variations.
Proceedings of the 40th Design Automation Conference, 2003
2002
IEEE Trans. Very Large Scale Integr. Syst., 2002
ACM Trans. Design Autom. Electr. Syst., 2002
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2002
Proceedings of the 2002 International Symposium on Low Power Electronics and Design, 2002
Proceedings of the 2002 IEEE International Conference on Field-Programmable Technology, 2002
Proceedings of the 39th Design Automation Conference, 2002
2001
IEEE Trans. Very Large Scale Integr. Syst., 2001
IEEE Trans. Very Large Scale Integr. Syst., 2001
Proceedings of the 2001 International Symposium on Low Power Electronics and Design, 2001
Proceedings of the 2001 8th IEEE International Conference on Electronics, 2001
Proceedings of the 2001 8th IEEE International Conference on Electronics, 2001
2000
IEEE Trans. Very Large Scale Integr. Syst., 2000
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2000
Proceedings of the Second IEEE/ACM International Workshop on System-Level Interconnect Prediction (SLIP 2000), 2000
Proceedings of the 1st International Symposium on Quality of Electronic Design (ISQED 2000), 2000
Proceedings of the 2000 International Symposium on Low Power Electronics and Design, 2000
1999
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1999
Proceedings of the 1999 International Symposium on Low Power Electronics and Design, 1999
Proceedings of the 1999 International Symposium on Low Power Electronics and Design, 1999
Proceedings of the 1999 International Symposium on Low Power Electronics and Design, 1999
1998
VLSI Design, 1998
Proceedings of the 35th Conference on Design Automation, 1998
1997
Proceedings of the 1997 IEEE/ACM International Conference on Computer-Aided Design, 1997
Proceedings of the European Design and Test Conference, 1997
Proceedings of the 34st Conference on Design Automation, 1997
Proceedings of the 34st Conference on Design Automation, 1997
1996
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1996
Proceedings of the 1996 International Symposium on Low Power Electronics and Design, 1996
1995
Pattern independent maximum current estimation in power and ground buses of CMOS VLSI circuits: Algorithms, signal correlations, and their resolution.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1995
Proceedings of the 1995 International Symposium on Low Power Design 1995, 1995
Proceedings of the 1995 IEEE/ACM International Conference on Computer-Aided Design, 1995
Proceedings of the 32st Conference on Design Automation, 1995
Proceedings of the 32st Conference on Design Automation, 1995
Proceedings of the 32st Conference on Design Automation, 1995
1994
IEEE Trans. Very Large Scale Integr. Syst., 1994
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1994
Improved Delay and Current Models for Estimating Maximum Currents in CMOS VLSI Circuits.
Proceedings of the 1994 IEEE International Symposium on Circuits and Systems, ISCAS 1994, London, England, UK, May 30, 1994
Proceedings of the 31st Conference on Design Automation, 1994
1993
IEEE Trans. Very Large Scale Integr. Syst., 1993
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1993
Resolving Signal Correlations for Estimating Maximum Currents in CMOS Combinational Circuits.
Proceedings of the 30th Design Automation Conference. Dallas, 1993
1992
Proceedings of the 1992 IEEE/ACM International Conference on Computer-Aided Design, 1992
Proceedings of the 29th Design Automation Conference, 1992
1991
An extension of probabilistic simulation for reliability analysis of CMOS VLSI circuits.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1991
Proceedings of the 28th Design Automation Conference, 1991
1990
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1990
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1990
1989
Proceedings of the Computer Design: VLSI in Computers and Processors, 1989
Proceedings of the 1989 IEEE International Conference on Computer-Aided Design, 1989
1988
Proceedings of the 1988 IEEE International Conference on Computer-Aided Design, 1988
Proceedings of the 25th ACM/IEEE Conference on Design Automation, 1988