Fangzhou Xia
Orcid: 0000-0002-6314-3717Affiliations:
- Massachusetts Institute of Technology, Mechatronics Research Laboratory, Cambridge, USA
According to our database1,
Fangzhou Xia
authored at least 10 papers
between 2017 and 2023.
Collaborative distances:
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Bibliography
2023
Robotic Method and Instrument to Efficiently Synthesize Faulty Conditions and Mass-Produce Faulty-Conditioned Data for Rotary Machines.
Proceedings of the IEEE International Conference on Robotics and Automation, 2023
Proceedings of the IEEE/ASME International Conference on Advanced Intelligent Mechatronics, 2023
2022
Physical Intelligence in the Metaverse: Mixed Reality Scale Models for Twistronics and Atomic Force Microscopy.
Proceedings of the IEEE/ASME International Conference on Advanced Intelligent Mechatronics, 2022
2021
Statically Stable Charge Sensing Method for Precise Displacement Estimation of Piezoelectric Stack-Based Nanopositioning.
IEEE Trans. Ind. Electron., 2021
Modeling and Control of Piezoelectric Hysteresis: A Polynomial-Based Fractional Order Disturbance Compensation Approach.
IEEE Trans. Ind. Electron., 2021
2019
Charge Controller With Decoupled and Self-Compensating Configurations for Linear Operation of Piezoelectric Actuators in a Wide Bandwidth.
IEEE Trans. Ind. Electron., 2019
Proceedings of the 2019 American Control Conference, 2019
Bandwidth Based Repetitive Controller Design for a Modular Multi-actuated AFM Scanner.
Proceedings of the 2019 American Control Conference, 2019
2018
Design and Control of a Multi-actuated High-bandwidth and Large-range Scanner for Atomic Force Microscopy.
Proceedings of the 2018 Annual American Control Conference, 2018
2017
Induced vibration contact detection for minimizing cantilever tip-sample interaction forces in jumping mode atomic force microscopy.
Proceedings of the 2017 American Control Conference, 2017