Fanchen Zhang

According to our database, Fanchen Zhang authored at least 6 papers between 2014 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2023

Increased Detection of Hard-to-Detect Stuck-at Faults during Scan Shift.

Hui Jiang, Fanchen Zhang, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas

J. Electron. Test., April, 2023

2019

Repurposing FPGAs for Tester Design to Enhance Field-Testing in a 3D Stack.

Yi Sun, Fanchen Zhang, Hui Jiang, Kundan Nepal, Jennifer Dworak, Theodore W. Manikas, R. Iris Bahar

J. Electron. Test., 2019

2018

One more time! Increasing fault detection with scan shift capture.

Hui Jiang, Fanchen Zhang, Yi Sun, Jennifer Dworak

Proceedings of the 27th IEEE North Atlantic Test Workshop, 2018

2016

Using Existing Reconfigurable Logic in 3D Die Stacks for Test.

Fanchen Zhang, Yi Sun, Xi Shen, Kundan Nepal, Jennifer Dworak, Theodore W. Manikas, Ping Gui, R. Iris Bahar, Al Crouch, John C. Potter

Proceedings of the 25th IEEE North Atlantic Test Workshop, 2016

Putting wasted clock cycles to use: Enhancing fortuitous cell-aware fault detection with scan shift capture.

Fanchen Zhang, Daphne Hwong, Yi Sun, Allison Garcia, Soha Alhelaly, Geoff Shofner, LeRoy Winemberg, Jennifer Dworak

Proceedings of the 2016 IEEE International Test Conference, 2016

2014

When Optimized N-Detect Test Sets are Biased: An Investigation of Cell-Aware-Type Faults and N-Detect Stuck-At ATPG.

Fanchen Zhang, Micah Thornton, Jennifer Dworak

Proceedings of the IEEE 23rd North Atlantic Test Workshop, 2014