Faguo Liang
Orcid: 0000-0002-7651-189X
According to our database1,
Faguo Liang
authored at least 3 papers
between 2016 and 2020.
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Bibliography
2020
Optimal Design of Passive Devices for Verifying On-Wafer Noise Parameter Measurement Systems.
IEEE Trans. Instrum. Meas., 2020
Monte Carlo Analysis of Measurement Uncertainties for On-Wafer Multiline TRL Calibration Including Dynamic Accuracy.
IEEE Trans. Instrum. Meas., 2020
2016
Transient dual interface measurement of junction-to-case thermal resistance in AlGaN/GaN HEMT utilizing an improved infrared microscope.
Microelectron. Reliab., 2016