Faguo Liang

Orcid: 0000-0002-7651-189X

According to our database1, Faguo Liang authored at least 3 papers between 2016 and 2020.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Links

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Bibliography

2020
Optimal Design of Passive Devices for Verifying On-Wafer Noise Parameter Measurement Systems.
IEEE Trans. Instrum. Meas., 2020

Monte Carlo Analysis of Measurement Uncertainties for On-Wafer Multiline TRL Calibration Including Dynamic Accuracy.
IEEE Trans. Instrum. Meas., 2020

2016
Transient dual interface measurement of junction-to-case thermal resistance in AlGaN/GaN HEMT utilizing an improved infrared microscope.
Microelectron. Reliab., 2016


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