Fabrice Caignet

According to our database, Fabrice Caignet authored at least 11 papers between 2000 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Analysis of Operational Amplifier Susceptibility to Multifrequency Disturbance.

A. Boyer, Fabrice Caignet

Proceedings of the 14th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, 2024

2021

Closed-Form Expressions of Electric and Magnetic Near-Fields for the Calibration of Near-Field Probes.

Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia

IEEE Trans. Instrum. Meas., 2021

2017

Prediction of LIN communication robustness against EFT events using dedicated failure models.

Frédéric Escudié, Fabrice Caignet, Nicolas Nolhier, Marise Bafleur

Microelectron. Reliab., 2017

2016

Impact of non-linear capacitances on transient waveforms during system level ESD stress.

Frédéric Escudié, Fabrice Caignet, Nicolas Nolhier, Marise Bafleur

Microelectron. Reliab., 2016

2015

20 GHz on-chip measurement of ESD waveform for system level analysis.

Fabrice Caignet, Nicolas Nolhier, Marise Bafleur, A. Wang, Nicolas Mauran

Microelectron. Reliab., 2015

2014

Reliability of ESD protection devices designed in a 3D technology.

Bertrand Courivaud, Nicolas Nolhier, Gilles Ferru, Marise Bafleur, Fabrice Caignet

Microelectron. Reliab., 2014

2013

Building-up of system level ESD modeling: Impact of a decoupling capacitance on ESD propagation.

Nicolas Monnereau, Fabrice Caignet, David Trémouilles, Nicolas Nolhier, Marise Bafleur

Microelectron. Reliab., 2013

On-chip measurement to analyze failure mechanisms of ICs under system level ESD stress.

Fabrice Caignet, Nicolas Nolhier, Marise Bafleur, A. Wang, Nicolas Mauran

Microelectron. Reliab., 2013

2008

Comparison among emission and susceptibility reduction techniques for electromagnetic interference in digital integrated circuits.

Ali Alaeldine, Nicolas Lacrampe, Alexandre Boyer, Richard Perdriau, Fabrice Caignet, Mohammed Ramdani, Etienne Sicard, M'hamed Drissi

Microelectron. J., 2008

2001

The challenge of signal integrity in deep-submicrometer CMOS technology.

Fabrice Caignet, Sonia Delmas-Bendhia, Etienne Sicard

Proc. IEEE, 2001

2000

On the measurement of crosstalk in integrated circuits.

Fabrice Caignet, S. D.-B. Dhia, Etienne Sicard

IEEE Trans. Very Large Scale Integr. Syst., 2000