F. Maugain

According to our database, F. Maugain authored at least 1 paper in 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2018

Threshold voltage bitmap analysis methodology: Application to a 512kB 40nm Flash memory test chip.

Thibault Kempf, Vincenzo Della Marca, L. Baron, F. Maugain, Francesco La Rosa, Stephan Niel, Arnaud Régnier, Jean-Michel Portal, Pascal Masson

Proceedings of the IEEE International Reliability Physics Symposium, 2018