F. Camerik

According to our database, F. Camerik authored at least 2 papers between 1989 and 1991.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

1991

A Generic Method to Develop a Defect Monitoring System for IC Processes.

Eric Bruls, F. Camerik, H. J. Kretschman, Jochen A. G. Jess

Proceedings of the Proceedings IEEE International Test Conference 1991, 1991

1989

Qualification and Quantification of Process-Induced Product-Related Defects.

F. Camerik, P. A. J. Dirks, Jochen A. G. Jess

Proceedings of the Proceedings International Test Conference 1989, 1989