Evgeniy A. Zhebrun

According to our database, Evgeniy A. Zhebrun authored at least 7 papers between 2013 and 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2017

Research of peak detector limiting characteristics for analog interface in impedance spectroscopy systems.

Leontiy K. Samoilov, Evgeniy A. Zhebrun, Nikolay N. Prokopenko, Petr S. Budyakov

Proceedings of the 24th IEEE International Conference on Electronics, Circuits and Systems, 2017

2015

The radiation-hardened instrumentation amplifier based on the differential difference operational amplifier for BiJFET technological process.

Alexey E. Titov, Nikolay N. Prokopenko, Evgeniy A. Zhebrun, Nikolay V. Butyrlagin

Proceedings of the 2015 IEEE East-West Design & Test Symposium, 2015

The peculiarities of the structural optimization of the energy-efficient precision ARC-filters on the base of classical and differential difference operational amplifiers.

Sergei G. Krutchinsky, Nikolay N. Prokopenko, Evgeniy A. Zhebrun, Nikolay V. Butyrlagin

Proceedings of the 2015 IEEE East-West Design & Test Symposium, 2015

Microwave Selective Amplifiers with High Asymptotic Attenuation in the Range of Subresonance Frequencies.

Nikolay N. Prokopenko, Nikolay V. Butyrlagin, Sergei G. Krutchinsky, Evgeniy A. Zhebrun, Alexey E. Titov

Proceedings of the 18th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2015

The Advanced Circuitry of the Precision Super Capacitances Based on the Classical and Differential Difference Operational Amplifiers.

Nikolay N. Prokopenko, Nikolay V. Butyrlagin, Sergei G. Krutchinsky, Evgeniy A. Zhebrun, Alexey E. Titov

Proceedings of the 18th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2015

2014

Selftest ADCs for smart sensors.

Sergei G. Krutchinsky, Evgeniy A. Zhebrun

Proceedings of the 2014 East-West Design & Test Symposium, 2014

2013

Schematic design of HF and UHF op-amp for SiGe technology.

Sergei G. Krutchinsky, Evgeniy A. Zhebrun, Victor A. Svizev

Proceedings of the East-West Design & Test Symposium, 2013