Evelyn Landman
According to our database1,
Evelyn Landman
authored at least 3 papers
between 2019 and 2022.
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Bibliography
2022
Applying Universal Chip Telemetry to Detect Latent Defects and Aging in Advanced Electronics.
Proceedings of the IEEE International Reliability Physics Symposium, 2022
2020
Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020
2019
Proceedings of the IEEE International Reliability Physics Symposium, 2019