Eugeni Isern

Orcid: 0000-0001-9332-794X

Affiliations:
  • University of the Balearic Islands, Department of Industrial Engineering and Construction, Palma, Spain


According to our database1, Eugeni Isern authored at least 43 papers between 1993 and 2023.

Collaborative distances:
  • Dijkstra number2 of four.
  • Erdős number3 of four.

Timeline

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Bibliography

2023
Corrections to "Digital implementation of Radial Basis Function Neural Networks Based on Stochastic Computing".
IEEE J. Emerg. Sel. Topics Circuits Syst., September, 2023

Digital Implementation of Radial Basis Function Neural Networks Based on Stochastic Computing.
IEEE J. Emerg. Sel. Topics Circuits Syst., March, 2023

Sensor node design and evaluation for quality assurance of drugs.
Proceedings of the 21st IEEE Interregional NEWCAS Conference, 2023

Monitoring Medicine Quality Conservation: An IoT-Based Platform Design.
Proceedings of the International Symposium on Networks, Computers and Communications, 2023

Approximate arithmetic aware training for stochastic computing neural networks.
Proceedings of the 38th Conference on Design of Circuits and Integrated Systems, 2023

2021
A Bulk-Controlled Low-Voltage CMOS Quadrature Oscillator.
CoRR, 2021

Stochastic Computing co-processing elements for Evolving Autonomous Data Partitioning.
Proceedings of the XXXVI Conference on Design of Circuits and Integrated Systems, 2021

2020
Efficient parallel implementation of reservoir computing systems.
Neural Comput. Appl., 2020

An 80 A, 2 to 25 ns Configurable Pulse-Width Integrated CMOS Pulsed Laser Driver with On-Chip Mounted Laser Diode.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2020

FPGA Implementation of Random Vector Functional Link Networks based on Elementary Cellular Automata.
Proceedings of the XXXV Conference on Design of Circuits and Integrated Systems, 2020

2019
Self-Organizing Maps hybrid Implementation Based on Stochastic Computing.
Proceedings of the XXXIV Conference on Design of Circuits and Integrated Systems, 2019

2018
Reservoir Computing Hardware for Time Series Forecasting.
Proceedings of the 28th International Symposium on Power and Timing Modeling, 2018

Cyclic Reservoir Computing with FPGA Devices for Efficient Channel Equalization.
Proceedings of the Artificial Intelligence and Soft Computing, 2018

2017
Noise tolerant probabilistic logic for statistical pattern recognition applications.
Integr. Comput. Aided Eng., 2017

Foreword.
Proceedings of the 12th International Conference on Design & Technology of Integrated Systems In Nanoscale Era, 2017

Analysis of two different charge injector candidates for an on-chip Floating Gate recharging system.
Proceedings of the 12th International Conference on Design & Technology of Integrated Systems In Nanoscale Era, 2017

2014
A new on-line bandwidth tuning approach for biquad OTA-C filters.
Microelectron. J., 2014

Method to evaluate energy saving techniques in data buses.
Proceedings of the 24th International Workshop on Power and Timing Modeling, 2014

2011
Band-Pass Filter Design with Diagnosis Facilities Based on Predictive Techniques.
J. Electron. Test., 2011

2010
Application of Predictive Oscillation-Based Test to a CMOS OpAmp.
IEEE Trans. Instrum. Meas., 2010

2009
Verifying Functional Specifications by Regression Techniques on Lissajous Test Signatures.
IEEE Trans. Circuits Syst. I Regul. Pap., 2009

Predictive test strategy for CMOS RF mixers.
Integr., 2009

Predictive Test Technique for Diagnosis of RF CMOS Receivers.
Proceedings of the 27th IEEE VLSI Test Symposium, 2009

2007
A Module for BiST of CMOS RF Receivers.
J. Electron. Test., 2007

2004
On-line Monitoring Capabilities of Oscillation Test Techniques: Results Demonstration in an OTA.
Proceedings of the 10th IEEE International On-Line Testing Symposium (IOLTS 2004), 2004

2003
Analysis of dissipation energy of switching digital CMOS gates with coupled outputs.
Microelectron. J., 2003

A new BICS for CMOS operational amplifiers by using oscillation test techniques.
Microelectron. J., 2003

A BICS for CMOS OpAmps by Monitoring the Supply Current Peak.
J. Electron. Test., 2003

Analysis of the Contribution of Interconnect Effects in the Energy Dissipation of VLSI Circuits.
Proceedings of the Integrated Circuit and System Design, 2003

A Configurable Built in Current Sensor for Mixed Signal Circuit Testing.
Proceedings of the 9th IEEE International On-Line Testing Symposium (IOLTS 2003), 2003

2002
A BICS for CMOS Opamps by Monitoring the Supply Current Peak.
Proceedings of the 8th IEEE International On-Line Testing Workshop (IOLTW 2002), 2002

2000
Experimental Results on BIC Sensors for Transient Current Testing.
J. Electron. Test., 2000

Transient Current Monitoring Using a Current-to-Frequency Converter.
Proceedings of the 1st Latin American Test Workshop, 2000

1999
Analyzing the Need for ATPG Targeting GOS Defects.
Proceedings of the 17th IEEE VLSI Test Symposium (VTS '99), 1999

1998
IDDQ testing: state of the art and future trends.
Integr., 1998

Clocked Dosimeter Compatible with Digital CMOS Technology.
J. Electron. Test., 1998

Integrated Cmos Linear Dosimeter.
Proceedings of the 11th Annual Symposium on Integrated Circuits Design, 1998

1997
I<sub>DDQ</sub> Detectable Bridges in Combinational CMOS Circuits.
VLSI Design, 1997

1995
IDDQ Test and Diagnosis of CMOS Circuits.
IEEE Des. Test Comput., 1995

1994
Analysis of I<sub>DDQ</sub> detectable bridges in combinational CMOS circuits.
Proceedings of the 12th IEEE VLSI Test Symposium (VTS'94), 1994

Test of Bridging Faults in Scan-based Sequential Circuits.
Proceedings of the EDAC - The European Conference on Design Automation, ETC - European Test Conference, EUROASIC - The European Event in ASIC Design, Proceedings, February 28, 1994

1993
Analysis of redundant structures in combinational circuits.
Proceedings of the 11th IEEE VLSI Test Symposium (VTS'93), 1993

Test Generation with High Coverages for Quiescent Current Test of Bridging Faults in Combinational Circuits.
Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993


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