Eugene R. Hnatek
According to our database1,
Eugene R. Hnatek
authored at least 13 papers
between 1976 and 1997.
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Timeline
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Book In proceedings Article PhD thesis Dataset OtherLinks
On csauthors.net:
Bibliography
1997
1995
User Application of Statistical Process Monitor Techniques to ASIC Critical Parameters.
Proceedings of the Proceedings IEEE International Test Conference 1995, 1995
1993
Proceedings of the Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics, 1993
1989
Proceedings of the Proceedings International Test Conference 1989, 1989
1986
IC Burn-In : The Changing Scene.
Proceedings of the Proceedings International Test Conference 1986, 1986
1984
Problems Encountered in Developing VLSI Test Programs for COT (A Practical Outlook).
Proceedings of the Proceedings International Test Conference 1984, 1984
Thoughts on VLSI Burn-in.
Proceedings of the Proceedings International Test Conference 1984, 1984
1982
An Evaluation of the 2816 EEPROM.
Proceedings of the Proceedings International Test Conference 1982, 1982
1981
Documentation for Testability : The Supplier's Responsibility to the User.
Proceedings of the Proceedings International Test Conference 1981, 1981
1977
Physics of computer memory devices: S Middelhoek, P K George and P Dekker. Academic Press (1976), 402 pp, £12.50.
Microprocess., 1977
1976