Esin Terzioglu
According to our database1,
Esin Terzioglu
authored at least 3 papers
between 2011 and 2013.
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Bibliography
2013
Experiments and analysis to characterize logic state retention limitations in 28nm process node.
Proceedings of the 31st IEEE VLSI Test Symposium, 2013
Analysis, modeling and silicon correlation of low-voltage flop data retention in 28nm process technology.
Proceedings of the International Symposium on Quality Electronic Design, 2013
2011
Characterization of SRAM sense amplifier input offset for yield prediction in 28nm CMOS.
Proceedings of the 2011 IEEE Custom Integrated Circuits Conference, 2011