Erkan Acar

According to our database1, Erkan Acar authored at least 17 papers between 2004 and 2010.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

Legend:

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PhD thesis 
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Links

On csauthors.net:

Bibliography

2010
Low Cost MIMO Testing for RF Integrated Circuits.
IEEE Trans. Very Large Scale Integr. Syst., 2010

2009
Low-Cost Characterization and Calibration of RF Integrated Circuits through I - Q Data Analysis.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009

Built-in EVM measurement for OFDM transceivers using all-digital DFT.
Proceedings of the 2009 IEEE International Test Conference, 2009

Defect Filter for Alternate RF Test.
Proceedings of the 14th IEEE European Test Symposium, 2009

2008
Defect-Oriented Testing of RF Circuits.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2008

Optimized EVM Testing for IEEE 802.11a/n RF ICs.
Proceedings of the 2008 IEEE International Test Conference, 2008

2007
Go/No-Go Testing of VCO Modulation RF Transceivers Through the Delayed-RF Setup.
IEEE Trans. Very Large Scale Integr. Syst., 2007

A Low-Cost RF MIMO Test Method Using a Single Measurement Set-up.
Proceedings of the 25th IEEE VLSI Test Symposium (VTS 2007), 2007

Test yield estimation for analog/RF circuits over multiple correlated measurements.
Proceedings of the 2007 IEEE International Test Conference, 2007

Low cost characterization of RF transceivers through IQ data analysis.
Proceedings of the 2007 IEEE International Test Conference, 2007

Digital calibration of RF transceivers for I-Q imbalances and nonlinearity.
Proceedings of the 25th International Conference on Computer Design, 2007

2006
Efficient Testing of RF MIMO Transceivers Used in WLAN Applications.
Proceedings of the 24th International Conference on Computer Design (ICCD 2006), 2006

Enhanced error vector magnitude (EVM) measurements for testing WLAN transceivers.
Proceedings of the 2006 International Conference on Computer-Aided Design, 2006

2005
Diagnosis of Failing Component in RF Receivers through Adaptive Full-Path Measurements.
Proceedings of the 23rd IEEE VLSI Test Symposium (VTS 2005), 2005

Defect-based RF testing using a new catastrophic fault model.
Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

Parametric test development for RF circuits targeting physical fault locations and using specification-based fault definitions.
Proceedings of the 2005 International Conference on Computer-Aided Design, 2005

2004
Delayed-RF Based Test Development for FM Transceivers Using Signature Analysis.
Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004


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