Erik H. Volkerink

According to our database, Erik H. Volkerink authored at least 13 papers between 2001 and 2010.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2010

The ABCs of ITC.

Ron Press, Erik H. Volkerink

IEEE Des. Test Comput., 2010

2007

Empirical Validation of Yield Recovery Using Idle-Cycle Insertion.

Donghwi Lee, Erik H. Volkerink, Intaik Park, Jeff Rearick

IEEE Des. Test Comput., 2007

2005

Response compaction with any number of unknowns using a new LFSR architecture.

Erik H. Volkerink, Subhasish Mitra

Proceedings of the 42nd Design Automation Conference, 2005

2004

Delay Defect Screening using Process Monitor Structures.

Subhasish Mitra, Erik H. Volkerink, Edward J. McCluskey, Stefan Eichenberger

Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004

ELF-Murphy Data on Defects and Test Sets.

Edward J. McCluskey, Ahmad A. Al-Yamani, Chien-Mo James Li, Chao-Wen Tseng, Erik H. Volkerink, François-Fabien Ferhani, Edward Li, Subhasish Mitra

Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004

Speed Clustering of Integrated Circuits.

Kenneth A. Brand, Erik H. Volkerink, Edward J. McCluskey, Subhasish Mitra

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

2003

Modern Test Techniques: Tradeoffs, Synergies, and Scalable Benefits.

Erik H. Volkerink, Ajay Khoche, Jochen Rivoir, Klaus-Dieter Hilliges

J. Electron. Test., 2003

Efficient Seed Utilization for Reseeding based Compression.

Erik H. Volkerink, Subhasish Mitra

Proceedings of the 21st IEEE VLSI Test Symposium (VTS 2003), 27 April, 2003

ATPG Padding And ATE Vector Repeat Per Port For Reducing Test Data Volume.

Harald P. E. Vranken, Friedrich Hapke, Soenke Rogge, Domenico Chindamo, Erik H. Volkerink

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

2002

Test Economics for Multi-site Test with Modern Cost Reduction Techniques.

Erik H. Volkerink, Ajay Khoche, Jochen Rivoir, Klaus-Dieter Hilliges

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

Test Vector Compression Using EDA-ATE Synergies.

Ajay Khoche, Erik H. Volkerink, Jochen Rivoir, Subhasish Mitra

Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002

Packet-Based Input Test Data Compression Techniques.

Erik H. Volkerink, Ajay Khoche, Subhasish Mitra

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

2001

Tackling test trade-offs from design, manufacturing to market using economic modeling.

Erik H. Volkerink, Ajay Khoche, Linda A. Kamas, Jochen Rivoir, Hans G. Kerkhoff

Proceedings of the Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October, 2001