Erich Gornik
Orcid: 0000-0001-5371-7935Affiliations:
- Vienna University of Technology, Faculty of Electrical Engineering and Information Technology, Austria
According to our database1,
Erich Gornik
authored at least 17 papers
between 2001 and 2011.
Collaborative distances:
Collaborative distances:
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Bibliography
2011
Application of transient interferometric mapping method for ESD and latch-up analysis.
Microelectron. Reliab., 2011
2010
Single pulse energy capability and failure modes of n- and p-channel LDMOS with thick copper metallization.
Microelectron. Reliab., 2010
2009
Transient interferometric mapping of carrier plasma during external transient latch-up phenomena in latch-up test structures and I/O cells processed in CMOS technology.
Microelectron. Reliab., 2009
Thermal imaging of smart power DMOS transistors in the thermally unstable regime using a compact transient interferometric mapping system.
Microelectron. Reliab., 2009
2007
Backside interferometric methods for localization of ESD-induced leakage current and metal shorts.
Microelectron. Reliab., 2007
2006
Analysis of triggering behaviour of high voltage CMOS LDMOS clamps and SCRs during ESD induced latch-up.
Microelectron. Reliab., 2006
2005
Scanning heterodyne interferometer setup for the time-resolved thermal and free-carrier mapping in semiconductor devices.
IEEE Trans. Instrum. Meas., 2005
Automated setup for thermal imaging and electrical degradation study of power DMOS devices.
Microelectron. Reliab., 2005
2004
Microelectron. Reliab., 2004
Transient interferometric mapping of smart power SOI ESD protection devices under TLP and vf-TLP stress.
Microelectron. Reliab., 2004
2003
A dual-beam Michelson interferometer for investigation of trigger dynamics in ESD protection devices under very fast TLP stress.
Microelectron. Reliab., 2003
Study of internal behavior in a vertical DMOS transistor under short high current stress by an interferometric mapping method.
Microelectron. Reliab., 2003
2002
Device Simulation and Backside Laser Interferometry--Powerful Tools for ESD Protection Development.
Microelectron. Reliab., 2002
Electrical field mapping in InGaP HEMTs and GaAs terahertz emitters using backside infrared OBIC technique.
Microelectron. Reliab., 2002
Experimental and simulation analysis of a BCD ESD protection element under the DC and TLP stress conditions.
Microelectron. Reliab., 2002
2001
Effect of pulse risetime on trigger homogeneity in single finger grounded gate nMOSFET electrostatic discharge protection devices.
Microelectron. Reliab., 2001
Thermal and free carrier laser interferometric mapping and failure analysis of anti-serial smart power ESD protection structures.
Microelectron. Reliab., 2001