Eric Liau
According to our database1,
Eric Liau
authored at least 8 papers
between 2003 and 2008.
Collaborative distances:
Collaborative distances:
Timeline
Legend:
Book In proceedings Article PhD thesis Dataset OtherLinks
On csauthors.net:
Bibliography
2008
Proceedings of the 2008 IEEE International Test Conference, 2008
2006
Proceedings of the 2006 IEEE International Test Conference, 2006
Pattern Pruner: Automatic Pattern Size Reduction Method that Uses Computational Intelligence-Based Testing.
Proceedings of the 2006 IEEE International Test Conference, 2006
A 1.8V p(seudo)SRAM using standard 140nm DRAM technology with self adapting clocked standby operation.
Proceedings of the International Symposium on Circuits and Systems (ISCAS 2006), 2006
2005
Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005
Proceedings of the 2005 Design, 2005
2003
Evolution of automatic semiconductor test equipment: automatic test pattern learning, classification, optimisation and generation for power supply noise.
Proceedings of the IEEE International Conference on Virtual Environments, 2003
Automatic worst case pattern generation using neural networks & genetic algorithm for estimation of switching noise on power supply lines in CMOS circuits.
Proceedings of the 8th European Test Workshop, 2003