Eric Ken Yong Teo

According to our database, Eric Ken Yong Teo authored at least 2 papers in 2021.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2021

The Implementation of a Smart Sampling Scheme C2O Utilizing Virtual Metrology in Semiconductor Manufacturing.

Tze Chiang Tin, Saw Chin Tan, Hing Yong, Jimmy Ook Hyun Kim, Eric Ken Yong Teo, Joanne Ching Yee Wong, Ching Kwang Lee, Peter Than, Angela Pei San Tan, Siew Chee Phang

IEEE Access, 2021

A Realizable Overlay Virtual Metrology System in Semiconductor Manufacturing: Proposal, Challenges and Future Perspective.

Tze Chiang Tin, Saw Chin Tan, Hing Yong, Jimmy Ook Hyun Kim, Eric Ken Yong Teo, Ching Kwang Lee, Peter Than, Angela Pei San Tan, Siew Chee Phang

IEEE Access, 2021