Eric Faehn

According to our database, Eric Faehn authored at least 13 papers between 2012 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

A Fast and Efficient Graph-Based Methodology for Cell-Aware Model Generation.

Gianmarco Mongelli, Eric Faehn, Dylan Robins, Patrick Girard, Arnaud Virazel

Proceedings of the IEEE International Test Conference, 2024

A Graph-Based Methodology for Speeding up Cell-Aware Model Generation.

Gianmarco Mongelli, Xhesila Xhafa, Eric Faehn, Dylan Robins, Patrick Girard, Arnaud Virazel

Proceedings of the 30th IEEE International Symposium on On-Line Testing and Robust System Design, 2024

Producing a Bidirectional ATPG Compliant Verilog-HDL Memory Model of SRAM.

D. Ronga, Xhesila Xhafa, Eric Faehn, Patrick Girard, Thibault Vayssade, Arnaud Virazel

Proceedings of the IEEE International Conference on Design, 2024

A Structural Testing Approach for SRAM Address Decoders Using Cell-Aware Methodology.

Xhesila Xhafa, Eric Faehn, Patrick Girard, Arnaud Virazel

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2024

2023

On Using Cell-Aware Methodology for SRAM Bit Cell Testing.

Xhesila Xhafa, Aymen Ladhar, Eric Faehn, Lorena Anghel, Gregory di Pendina, Patrick Girard, Arnaud Virazel

Proceedings of the IEEE European Test Symposium, 2023

2022

Run-Time Hardware Trojan Detection in Analog and Mixed-Signal ICs.

Antonios Pavlidis, Eric Faehn, Marie-Minerve Louërat, Haralampos-G. Stratigopoulos

Proceedings of the 40th IEEE VLSI Test Symposium, 2022

Circuit-to-Circuit Attacks in SoCs via Trojan-Infected IEEE 1687 Test Infrastructure.

Michele Portolan, Antonios Pavlidis, Giorgio Di Natale, Eric Faehn, Haralampos-G. Stratigopoulos

Proceedings of the IEEE International Test Conference, 2022

2021

SymBIST: Symmetry-Based Analog and Mixed-Signal Built-In Self-Test for Functional Safety.

Antonios Pavlidis, Marie-Minerve Louërat, Eric Faehn, Anand Kumar, Haralampos-G. Stratigopoulos

IEEE Trans. Circuits Syst. I Regul. Pap., 2021

BIST-Assisted Analog Fault Diagnosis.

Antonios Pavlidis, Eric Faehn, Marie-Minerve Louërat, Haralampos-G. Stratigopoulos

Proceedings of the 26th IEEE European Test Symposium, 2021

2020

Symmetry-based A/M-S BIST (SymBIST): Demonstration on a SAR ADC IP.

Antonios Pavlidis, Marie-Minerve Louërat, Eric Faehn, Anand Kumar, Haralampos-G. D. Stratigopoulos

Proceedings of the 2020 Design, Automation & Test in Europe Conference & Exhibition, 2020

2019

Towards Improvement of Mission Mode Failure Diagnosis for System-on-Chip.

Safa Mhamdi, Arnaud Virazel, Patrick Girard, Alberto Bosio, Etienne Auvray, Eric Faehn, Aymen Ladhar

Proceedings of the 25th IEEE International Symposium on On-Line Testing and Robust System Design, 2019

2018

An Effective Intra-Cell Diagnosis Flow for Industrial SRAMs.

Tien-Phu Ho, Eric Faehn, Arnaud Virazel, Alberto Bosio, Patrick Girard

Proceedings of the IEEE International Test Conference, 2018

2012

A Hybrid Flow for Memory Failure Bitmap Classification.

Jianbo Li, Yu Huang, Wu-Tung Cheng, Chris Schuermyer, Dong Xiang, Eric Faehn, Ruth Farrugia

Proceedings of the 21st IEEE Asian Test Symposium, 2012