Erfan Abbasian

Orcid: 0000-0003-0073-8737

Affiliations:
  • Babol Noshirvani University of Technology, Iran


According to our database1, Erfan Abbasian authored at least 14 papers between 2021 and 2024.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of five.

Timeline

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Bibliography

2024
A Low-Energy, Stable, Single-Bitline Accessed FinFET 9T-SRAM.
Circuits Syst. Signal Process., August, 2024

2023
An ultra-low power and energy-efficient ternary Half-Adder based on unary operators and two ternary 3:1 multiplexers in 32-nm GNRFET technology.
Int. J. Circuit Theory Appl., October, 2023

Energy-Efficient Single-Ended Read/Write 10T Near-Threshold SRAM.
IEEE Trans. Circuits Syst. I Regul. Pap., May, 2023

Design of a 10-nm FinFET 11 T Near-Threshold SRAM Cell for Low-Energy Internet-of-Things Applications.
Circuits Syst. Signal Process., May, 2023

2022
A Reliable Low Standby Power 10T SRAM Cell With Expanded Static Noise Margins.
IEEE Trans. Circuits Syst. I Regul. Pap., 2022

A Highly Stable Low-Energy 10T SRAM for Near-Threshold Operation.
IEEE Trans. Circuits Syst. I Regul. Pap., 2022

Ultra-low-power and stable 10-nm FinFET 10T sub-threshold SRAM.
Microelectron. J., 2022

Improved read/write assist mechanism for 10-transistor static random access memory cell.
Int. J. Circuit Theory Appl., 2022

A low-leakage single-bitline 9T SRAM cell with read-disturbance removal and high writability for low-power biomedical applications.
Int. J. Circuit Theory Appl., 2022

Design and investigation of stability- and power-improved 11T SRAM cell for low-power devices.
Int. J. Circuit Theory Appl., 2022

A Schmitt-Trigger-Based Low-Voltage 11 T SRAM Cell for Low-Leakage in 7-nm FinFET Technology.
Circuits Syst. Signal Process., 2022

Design of a Highly Stable and Robust 10T SRAM Cell for Low-Power Portable Applications.
Circuits Syst. Signal Process., 2022

2021
Performance evaluation of GNRFET and TMDFET devices in static random access memory cells design.
Int. J. Circuit Theory Appl., 2021

Single-ended half-select disturb-free 11T static random access memory cell for reliable and low power applications.
Int. J. Circuit Theory Appl., 2021


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