Erbing Hua

According to our database1, Erbing Hua authored at least 2 papers in 2024.

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Bibliography

2024
Robust Design-for-Testability Scheme for Conventional and Unique Defects in RRAMs.
Proceedings of the IEEE International Test Conference, 2024

Multi-level forming-free HfO2-based ReRAM for energy-efficient computing.
Proceedings of the Device Research Conference, 2024


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