Enrico Costenaro

According to our database, Enrico Costenaro authored at least 17 papers between 2011 and 2015.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2015

Comprehensive Analysis of Sequential and Combinational Soft Errors in an Embedded Processor.

Mojtaba Ebrahimi, Adrian Evans, Mehdi Baradaran Tahoori, Enrico Costenaro, Dan Alexandrescu, Vikas Chandra, Razi Seyyedi

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015

Flip-flop SEU reduction through minimization of the temporal vulnerability factor (TVF).

Adrian Evans, Enrico Costenaro, Arkady Bramnik

Proceedings of the 21st IEEE International On-Line Testing Symposium, 2015

A call for cross-layer and cross-domain reliability analysis and management.

Dan Alexandrescu, Adrian Evans, Enrico Costenaro, Maximilien Glorieux

Proceedings of the 21st IEEE International On-Line Testing Symposium, 2015

2014

Managing SER costs of complex systems through Linear Programming.

Dan Alexandrescu, Nematollah Bidokhti, Andy Yu, Adrian Evans, Enrico Costenaro

Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, 2014

Exploring the state dependent SET sensitivity of asynchronous logic - The muller-pipeline example.

Andreas Steininger, Varadan Savulimedu Veeravalli, Dan Alexandrescu, Enrico Costenaro, Lorena Anghel

Proceedings of the 32nd IEEE International Conference on Computer Design, 2014

INFORMER: An integrated framework for early-stage memory robustness analysis.

Shrikanth Ganapathy, Ramon Canal, Dan Alexandrescu, Enrico Costenaro, Antonio González, Antonio Rubio

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

Comprehensive analysis of alpha and neutron particle-induced soft errors in an embedded processor at nanoscales.

Mojtaba Ebrahimi, Adrian Evans, Mehdi Baradaran Tahoori, Razi Seyyedi, Enrico Costenaro, Dan Alexandrescu

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2014

2013

A Practical Approach to Single Event Transient Analysis for Highly Complex Design.

Enrico Costenaro, Dan Alexandrescu, Kader Belhaddad, Michael Nicolaidis

J. Electron. Test., 2013

Pulse-length determination techniques in the rectangular single event transient fault model.

Alireza Rohani, Hans G. Kerkhoff, Enrico Costenaro, Dan Alexandrescu

Proceedings of the 2013 International Conference on Embedded Computer Systems: Architectures, 2013

Hierarchical RTL-based combinatorial SER estimation.

Adrian Evans, Dan Alexandrescu, Enrico Costenaro, Liang Chen

Proceedings of the 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 2013

State-aware single event analysis for sequential logic.

Dan Alexandrescu, Enrico Costenaro, Adrian Evans

Proceedings of the 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 2013

2012

A real-case application of a synergetic design-flow-oriented SER analysis.

Miguel Vilchis, Ramnath Venkatraman, Enrico Costenaro, Dan Alexandrescu

Proceedings of the 18th IEEE International On-Line Testing Symposium, 2012

RIIF - Reliability information interchange format.

Adrian Evans, Michael Nicolaidis, Shi-Jie Wen, Dan Alexandrescu, Enrico Costenaro

Proceedings of the 18th IEEE International On-Line Testing Symposium, 2012

Towards optimized functional evaluation of SEE-induced failures in complex designs.

Dan Alexandrescu, Enrico Costenaro

Proceedings of the 18th IEEE International On-Line Testing Symposium, 2012

A novel variation-tolerant 4T-DRAM cell with enhanced soft-error tolerance.

Shrikanth Ganapathy, Ramon Canal, Dan Alexandrescu, Enrico Costenaro, Antonio González, Antonio Rubio

Proceedings of the 30th International IEEE Conference on Computer Design, 2012

2011

A new IP core for fast error detection and fault tolerance in COTS-based solid state mass memories.

Enrico Costenaro, Massimo Violante, Dan Alexandrescu

Proceedings of the 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 2011

A Practical Approach to Single Event Transients Analysis for Highly Complex Designs.

Dan Alexandrescu, Enrico Costenaro, Michael Nicolaidis

Proceedings of the 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2011