Ender Yilmaz

According to our database, Ender Yilmaz authored at least 30 papers between 2007 and 2021.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2021

Fault-based Built-in Self-test and Evaluation of Phase Locked Loops.

Mehmet Ince, Ender Yilmaz, Wei Fu, Joonsung Park, Krishnaswamy Nagaraj, LeRoy Winemberg, Sule Ozev

ACM Trans. Design Autom. Electr. Syst., 2021

2019

Adaptive Test for RF/Analog Circuit Using Higher Order Correlations among Measurements.

Yanjun Li, Ender Yilmaz, Pete Sarson, Sule Ozev

ACM Trans. Design Autom. Electr. Syst., 2019

Digital Built-in Self-Test for Phased Locked Loops to Enable Fault Detection.

Mehmet Ince, Ender Yilmaz, Wei Fu, Joonsung Park, Krishnaswamy Nagaraj, LeRoy Winemberg, Sule Ozev

Proceedings of the 24th IEEE European Test Symposium, 2019

2018

Online information utility assessment for per-device adaptive test flow.

Yanjun Li, Ender Yilmaz, Peter Sarson, Sule Ozev

Proceedings of the 36th IEEE VLSI Test Symposium, 2018

Enabling fast process variation and fault simulation through macromodelling of analog components.

Mehmet Ince, Ender Yilmaz, Sule Ozev

Proceedings of the 27th IEEE North Atlantic Test Workshop, 2018

Design of aging aware 5 Gbps LVDS transmitter for automotive applications.

Srikanth Jagannathan, Kumar Abhishek, Nihaar N. Mahatme, Ender Yilmaz

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2017

Built-in self-test for stability measurement of low dropout regulator.

Jae Woong Jeong, Ender Yilmaz, LeRoy Winemberg, Sule Ozev

Proceedings of the IEEE International Test Conference, 2017

Evaluation of loop transfer function based dynamic testing of LDOs.

Mehmet Ince, Ender Yilmaz, Jae Woong Jeong, LeRoy Winemberg, Sule Ozev

Proceedings of the International Test Conference in Asia, 2017

2015

Adaptive-Learning-Based Importance Sampling for Analog Circuit DPPM Estimation.

Ender Yilmaz, Sule Ozev

IEEE Des. Test, 2015

2014

Built-In EVM Measurement With Negligible Hardware Overhead.

Ender Yilmaz, Afsaneh Nassery, Sule Ozev

IEEE Des. Test, 2014

2013

Per-Device Adaptive Test for Analog/RF Circuits Using Entropy-Based Process Monitoring.

Ender Yilmaz, Sule Ozev, Kenneth M. Butler

IEEE Trans. Very Large Scale Integr. Syst., 2013

Efficient Process Shift Detection and Test Realignment.

Ender Yilmaz, Sule Ozev, Kenneth M. Butler

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2013

Adaptive quality binning for analog circuits.

Ender Yilmaz, Sule Ozev, Kenneth M. Butler

Proceedings of the 18th IEEE European Test Symposium, 2013

Fault analysis and simulation of large scale industrial mixed-signal circuits.

Ender Yilmaz, Geoff Shofner, LeRoy Winemberg, Sule Ozev

Proceedings of the Design, Automation and Test in Europe, 2013

Adaptive reduction of the frequency search space for multi-vdd digital circuits.

Chandra K. H. Suresh, Ender Yilmaz, Sule Ozev, Ozgur Sinanoglu

Proceedings of the Design, Automation and Test in Europe, 2013

Electrical calibration of spring-mass MEMS capacitive accelerometers.

Lingfei Deng, Vinay Kundur, Naveen Sai Jangala Naga, Muhlis Kenan Ozel, Ender Yilmaz, Sule Ozev, Bertan Bakkaloglu, Sayfe Kiaei, Divya Pratab, Tehmoor Dar

Proceedings of the Design, Automation and Test in Europe, 2013

2012

Test Application for Analog/RF Circuits With Low Computational Burden.

Ender Yilmaz, Sule Ozev

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012

Adaptive testing: Conquering process variations.

Ender Yilmaz, Sule Ozev, Ozgur Sinanoglu, Peter C. Maxwell

Proceedings of the 17th IEEE European Test Symposium, 2012

Adaptive multi-site testing for analog/mixed-signal circuits incorporating neighborhood information.

Ender Yilmaz, Sule Ozev

Proceedings of the 17th IEEE European Test Symposium, 2012

2011

An industrial case study of analog fault modeling.

Ender Yilmaz, Anne Meixner, Sule Ozev

Proceedings of the 29th IEEE VLSI Test Symposium, 2011

Adaptive multidimensional outlier analysis for analog and mixed signal circuits.

Ender Yilmaz, Sule Ozev, Kenneth M. Butler

Proceedings of the 2011 IEEE International Test Conference, 2011

Fast and Accurate DPPM Computation Using Model Based Filtering.

Ender Yilmaz, Sule Ozev

Proceedings of the 16th European Test Symposium, 2011

2010

Adaptive test flow for mixed-signal/RF circuits using learned information from device under test.

Ender Yilmaz, Sule Ozev, Kenneth M. Butler

Proceedings of the 2011 IEEE International Test Conference, 2010

Accurate multi-specification DPPM estimation using layered sampling based simulation.

Ender Yilmaz

Proceedings of the 11th International Symposium on Quality of Electronic Design (ISQED 2010), 2010

2009

Analog Layout Generator for CMOS Circuits.

Ender Yilmaz, Günhan Dündar

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009

Built-in EVM measurement for OFDM transceivers using all-digital DFT.

Ender Yilmaz, Afsaneh Nassery, Sule Ozev, Erkan Acar

Proceedings of the 2009 IEEE International Test Conference, 2009

Defect-based test optimization for analog/RF circuits for near-zero DPPM applications.

Ender Yilmaz, Sule Ozev

Proceedings of the 27th International Conference on Computer Design, 2009

Adaptive test elimination for analog/RF circuits.

Ender Yilmaz, Sule Ozev

Proceedings of the 46th Design Automation Conference, 2009

2008

Dynamic test scheduling for analog circuits for improved test quality.

Ender Yilmaz, Sule Ozev

Proceedings of the 26th International Conference on Computer Design, 2008

2007

New layout generator for analog CMOS circuits.

Ender Yilmaz, Günhan Dündar

Proceedings of the 18th European Conference on Circuit Theory and Design, 2007