Emmanuel Nti Darko

According to our database, Emmanuel Nti Darko authored at least 7 papers between 2023 and 2024.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2024

A BIST Approach to Approximate Co-Testing of Embedded Data Converters.

Kushagra Bhatheja, Shravan K. Chaganti, Johnathan Leisinger, Emmanuel Nti Darko, Isaac Bruce, Degang Chen

IEEE Des. Test, June, 2024

A Direct Current-to-digital converter (DCDC) for Advanced Current Measurement in System-on-Chip (SOC) Designs.

Saeid Karimpour, Isaac Bruce, Michael Sekyere, Ruohan Yang, Emmanuel Nti Darko, Degang Chen

Proceedings of the 67th IEEE International Midwest Symposium on Circuits and Systems, 2024

Redundancy Based Resistor String DAC with an all Digital Calibration Algorithm.

Isaac Bruce, Emmanuel Nti Darko, Ekaniyere Oko-Odion, Matthew Crabb, Degang Chen

Proceedings of the 67th IEEE International Midwest Symposium on Circuits and Systems, 2024

Ultra-Small Area, Highly Linear, Modified All Mosfet Digital-to-Analog Converters with Novel Real Time Digital Calibration Algorithm.

Ekaniyere Oko-Odion, Isaac Bruce, Emmanuel Nti Darko, Michael Sekyere, Degang Chen

Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2024

A 3-Segment Interpolating String DAC with Low-Cost Built-In-Self-Test Capabilities.

Isaac Bruce, Emmanuel Nti Darko, Ekaniyere Oko-Odion, Kushagra Bhatheja, Matthew Crabb, Degang Chen

Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2024

2023

Ultra-Small Area, Highly Linear Sub-Radix R-2R Digital-To-Analog Converters with Novel Calibration Algorithm.

Michael Sekyere, Emmanuel Nti Darko, Isaac Bruce, Ekaniyere Oko-Odion, Kushagra Bhatheja, Degang Chen

Proceedings of the 66th IEEE International Midwest Symposium on Circuits and Systems, 2023

Small Area, High Accuracy Sub-Radix Resistive Current Mode Digital-To-Analog Converter with Novel Calibration Algorithm.

Isaac Bruce, Michael Sekyere, Emmanuel Nti Darko, Ekaniyere Oko-Odion, Kushagra Bhatheja, Degang Chen

Proceedings of the 66th IEEE International Midwest Symposium on Circuits and Systems, 2023