Emmanuel Bender

Orcid: 0000-0003-1632-9663

According to our database¹, Emmanuel Bender authored at least 4 papers between 2017 and 2023.

Collaborative distances:

Dijkstra number² of five.
Erdős number³ of four.

Timeline

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In proceedings

Article

PhD thesis

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Bibliography

2023

The Correct Hot Carrier Degradation Model.

[BibT_eX]

[DOI]

Joseph B. Bernstein

Emmanuel Bender

Alain Bensoussan

Proceedings of the IEEE International Reliability Physics Symposium, 2023

The Effects of Process Variations and BTI in Packaged FinFET Devices.

[BibT_eX]

[DOI]

Emmanuel Bender

Joseph B. Bernstein

Duane S. Boning

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2021

Microchip Health Monitoring System Using the FLL Circuit.

[BibT_eX]

[DOI]

Emmanuel Bender

Joseph B. Bernstein

Sensors, 2021

2017

Reliability prediction with MTOL.

[BibT_eX]

[DOI]

Joseph B. Bernstein

Alain Bensoussan

Emmanuel Bender

Microelectron. Reliab., 2017

Emmanuel Bender

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Bibliography

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