Emilien Bouyssou

According to our database, Emilien Bouyssou authored at least 3 papers between 2008 and 2009.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2009

Failure mechanisms of discrete protection device subjected to repetitive electrostatic discharges (ESD).

Marianne Diatta, Emilien Bouyssou, David Trémouilles, P. Martinez, F. Roqueta, O. Ory, Marise Bafleur

Microelectron. Reliab., 2009

Percolation theory applied to PZT thin films capacitors breakdown mechanisms.

Mohamed-Tahar Chentir, J.-B. Jullien, B. Valtchanov, Emilien Bouyssou, Laurent Ventura, Christine Anceau

Microelectron. Reliab., 2009

2008

Reliability study of TaON capacitors: From leakage current characterization to ESD robustness prediction.

M. Verchiani, Emilien Bouyssou, Guillaume Fiannaca, F. Cantin, Christine Anceau, Pierre Ranson

Microelectron. Reliab., 2008