Elyse Rosenbaum

According to our database, Elyse Rosenbaum authored at least 51 papers between 1993 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

Reduced RC Time Constant High Voltage Tolerant Supply Clamp for ESD Protection in 16nm FinFET Technology.

Shudong Huang, Srivatsan Parthasarathy, Yuanzhong Paul Zhou, Jean-Jacques Hajjar, Elyse Rosenbaum

Proceedings of the IEEE International Reliability Physics Symposium, 2024

On-Chip Single-Shot Pulse Generator for TDDB Characterization on a Sub-Nanosecond Timescale.

Matthew Drallmeier, Yujie Zhou, Elyse Rosenbaum

Proceedings of the IEEE International Reliability Physics Symposium, 2024

2023

Collector Engineering of ESD PNP in BCD Technologies.

Yujie Zhou, David LaFonteese, Elyse Rosenbaum

Proceedings of the IEEE International Reliability Physics Symposium, 2023

Semantic Autoencoder for Modeling BEOL and MOL Dielectric Lifetime Distributions.

Weiman Yan, Ernest Wu, Alexander G. Schwing, Elyse Rosenbaum

Proceedings of the IEEE International Reliability Physics Symposium, 2023

Optimization of SCR for High-Speed Digital and RF Applications in 45-nm SOI CMOS Technology.

Shudong Huang, Srivatsan Parthasarathy, Yuanzhong Paul Zhou, Jean-Jacques Hajjar, Elyse Rosenbaum

Proceedings of the IEEE International Reliability Physics Symposium, 2023

2022

Input-to-State Stable Neural Ordinary Differential Equations with Applications to Transient Modeling of Circuits.

Alan Yang, Jie Xiong, Maxim Raginsky, Elyse Rosenbaum

Proceedings of the Learning for Dynamics and Control Conference, 2022

A High Voltage Tolerant Supply Clamp for ESD Protection in a 45-nm SOI Technology.

Shudong Huang, Srivatsan Parthasarathy, Yuanzhong Paul Zhou, Jean-Jacques Hajjar, Elyse Rosenbaum

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2021

Neural Networks for Transient Modeling of Circuits : Invited Paper.

Jie Xiong, Alan Yang, Maxim Raginsky, Elyse Rosenbaum

Proceedings of the 3rd ACM/IEEE Workshop on Machine Learning for CAD, 2021

Considerations in High Voltage Lateral ESD PNP Design.

Milan Shah, Yujie Zhou, David LaFonteese, Elyse Rosenbaum

Proceedings of the IEEE International Reliability Physics Symposium, 2021

Compact Model of ESD Diode Suitable for Subnanosecond Switching Transients.

Shudong Huang, Elyse Rosenbaum

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020

Analysis and Design of Integrated Voltage Regulators for Supply Noise Rejection During System-Level ESD.

Yang Xiu, Elyse Rosenbaum

IEEE Trans. Circuits Syst., 2020

Model-Augmented Conditional Mutual Information Estimation for Feature Selection.

Alan Yang, AmirEmad Ghassami, Maxim Raginsky, Negar Kiyavash, Elyse Rosenbaum

Proceedings of the Thirty-Sixth Conference on Uncertainty in Artificial Intelligence, 2020

An Interpretable Predictive Model for Early Detection of Hardware Failure.

Artsiom Balakir, Alan Yang, Elyse Rosenbaum

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

Sub-nanosecond Reverse Recovery Measurement for ESD Devices.

Alex Ayling, Shudong Huang, Elyse Rosenbaum

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019

Model-Augmented Nearest-Neighbor Estimation of Conditional Mutual Information for Feature Selection.

Alan Yang, AmirEmad Ghassami, Maxim Raginsky, Negar Kiyavash, Elyse Rosenbaum

CoRR, 2019

Guilty As Charged: Computational Reliability Threats Posed By Electrostatic Discharge-induced Soft Errors.

Keven Feng, Sandeep Vora, Rui Jiang, Elyse Rosenbaum, Shobha Vasudevan

Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2019

2018

Stochastic modeling of air electrostatic discharge parameters.

Yang Xiu, Samuel Sagan, Advika Battini, Xiao Ma, Maxim Raginsky, Elyse Rosenbaum

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2016

A Study of BER-Optimal ADC-Based Receiver for Serial Links.

Yingyan Lin, Min-Sun Keel, Adam C. Faust, Aolin Xu, Naresh R. Shanbhag, Elyse Rosenbaum, Andrew C. Singer

IEEE Trans. Circuits Syst. I Regul. Pap., 2016

Full-Component Modeling and Simulation of Charged Device Model ESD.

Kuo-Hsuan Meng, Vrashank Shukla, Elyse Rosenbaum

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2016

Compact distributed multi-finger MOSFET model for circuit-level ESD simulation.

Kuo-Hsuan Meng, Zaichen Chen, Elyse Rosenbaum

Microelectron. Reliab., 2016

2015

Improved GGSCR layout for overshoot reduction.

Zaichen Chen, Robert Mertens, Collin Reiman, Elyse Rosenbaum

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2012

FEC-based 4 Gb/s backplane transceiver in 90nm CMOS.

Adam C. Faust, Rajan Narasimha, Karan S. Bhatia, Ankit Srivastava, Chhay Kong, Hyeon-Min Bae, Elyse Rosenbaum, Naresh R. Shanbhag

Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, 2012

2011

CDM-ESD induced damage in components using stacked-die packaging.

Nicholas Olson, Nathan Jack, Vrashank Shukla, Elyse Rosenbaum

Proceedings of the 2011 IEEE Custom Integrated Circuits Conference, 2011

ESD protection networks for 3D integrated circuits.

Elyse Rosenbaum, Vrashank Shukla, Min-Sun Keel

Proceedings of the 2011 IEEE International 3D Systems Integration Conference (3DIC), Osaka, Japan, January 31, 2011

2009

A new compact model for external latchup.

Farzan Farbiz, Elyse Rosenbaum

Microelectron. Reliab., 2009

Moving signals on and off chip.

Elyse Rosenbaum, Hyeon-Min Bae, Karan S. Bhatia, Adam C. Faust

Proceedings of the IEEE Custom Integrated Circuits Conference, 2009

2008

UVeriESD: An ESD verification tool for SoC design.

Kelvin K. Hsueh, Sin-Hao Ke, Jeffrey Lee, Elyse Rosenbaum

Proceedings of the IEEE Asia Pacific Conference on Circuits and Systems, 2008

2007

A Compact, ESD-Protected, SiGe BiCMOS LNA for Ultra-Wideband Applications.

Karan S. Bhatia, Sami Hyvonen, Elyse Rosenbaum

IEEE J. Solid State Circuits, 2007

2006

An automated and efficient substrate noise analysis tool.

Hongmei Li, Cole E. Zemke, Giorgos Manetas, Vladimir I. Okhmatovski, Elyse Rosenbaum, Andreas C. Cangellaris

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006

Compact modeling of on-chip ESD protection devices using Verilog-A.

Junjun Li, Sopan Joshi, Ryan Barnes, Elyse Rosenbaum

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006

An 8-mW, ESD-protected, CMOS LNA for Ultra-Wideband Applications.

Karan S. Bhatia, Sami Hyvonen, Elyse Rosenbaum

Proceedings of the IEEE 2006 Custom Integrated Circuits Conference, 2006

2005

Comprehensive ESD protection for RF inputs.

Sami Hyvonen, Sopan Joshi, Elyse Rosenbaum

Microelectron. Reliab., 2005

On-chip ESD protection for RF I/Os: devices, circuits and models.

Elyse Rosenbaum, Sami Hyvonen

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005

2004

Critical evaluation of SOI design guidelines.

Rouwaida Kanj, Elyse Rosenbaum

IEEE Trans. Very Large Scale Integr. Syst., 2004

Noise characterization of static CMOS gates.

Rouwaida Kanj, Timothy Lehner, Bhavna Agrawal, Elyse Rosenbaum

Proceedings of the 41th Design Automation Conference, 2004

2003

Simulator-independent compact modeling of vertical npn transistors for ESD and RF circuit simulation.

Sopan Joshi, Elyse Rosenbaum

Microelectron. Reliab., 2003

A Verilog-A compact model for ESD protection NMOSTs.

Junjun Li, Sopan Joshi, Elyse Rosenbaum

Proceedings of the IEEE Custom Integrated Circuits Conference, 2003

2002

A critical look at design guidelines for SOI logic gates.

Rouwaida Kanj, Elyse Rosenbaum

Proceedings of the 2002 International Symposium on Circuits and Systems, 2002

Comprehensive frequency-dependent substrate noise analysis using boundary element methods.

Hongmei Li, Jorge Carballido, Harry H. Yu, Vladimir I. Okhmatovski, Elyse Rosenbaum, Andreas C. Cangellaris

Proceedings of the 2002 IEEE/ACM International Conference on Computer-aided Design, 2002

2001

Breakdown and latent damage of ultra-thin gate oxides under ESD stress conditions.

Jie Wu, Patrick Juliano, Elyse Rosenbaum

Microelectron. Reliab., 2001

Electrothermal model for simulation of bulk-Si and SOI diodes in ESD protection circuits.

Yu Wang, Patrick Juliano, Sopan Joshi, Elyse Rosenbaum

Microelectron. Reliab., 2001

Trap generation and breakdown processes in very thin gate oxides.

Elyse Rosenbaum, Jie Wu

Microelectron. Reliab., 2001

2000

Interconnect thermal modeling for accurate simulation of circuittiming and reliability.

Danqing Chen, Erhong Li, Elyse Rosenbaum, Sung-Mo Kang

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2000

1999

Interconnect thermal modeling for determining design limits on current density.

Danqing Chen, Erhong Li, Elyse Rosenbaum, Sung-Mo Kang

Proceedings of the 1999 International Symposium on Physical Design, 1999

Substrate Modeling and Lumped Substrate Resistance Extraction for CMOS ESD/Latchup Circuit Simulation.

Tong Li, Ching-Han Tsai, Elyse Rosenbaum, Sung-Mo Kang

Proceedings of the 36th Conference on Design Automation, 1999

1998

ILLIADS-T: an electrothermal timing simulator for temperature-sensitive reliability diagnosis of CMOS VLSI chips.

Yi-Kan Cheng, Prasun Raha, Chin-Chi Teng, Elyse Rosenbaum, Sung-Mo Kang

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1998

1997

iTEM: a temperature-dependent electromigration reliability diagnosis tool.

Chin-Chi Teng, Yi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1997

1996

ETS-A: A New Electrothermal Simulator for CMOS VLSI Circuits.

Yi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang

Proceedings of the 1996 European Design and Test Conference, 1996

Hierarchical Electromigration Reliability Diagnosis for VLSI Interconnects.

Chin-Chi Teng, Yi-Kan Cheng, Elyse Rosenbaum, Sung-Mo Kang

Proceedings of the 33st Conference on Design Automation, 1996

iCET: A Complete Chip-Level Thermal Reliability Diagnosis Tool for CMOS VLSI Chips.

Yi-Kan Cheng, Chin-Chi Teng, Abhijit Dharchoudhury, Elyse Rosenbaum, Sung-Mo Kang

Proceedings of the 33st Conference on Design Automation, 1996

1993

Berkeley reliability tools-BERT.

Robert H. Tu, Elyse Rosenbaum, Wilson Y. Chan, Chester C. Li, Eric R. Minami, Khandker N. Quader, Ping K. Ko, Chenming Hu

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1993