Elif Alpaslan

According to our database, Elif Alpaslan authored at least 4 papers between 2008 and 2012.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2012

NIM-X: A Noise Index Model-Based X-Filling Technique to Overcome the Power Supply Switching Noise Effects on Path Delay Test.

Elif Alpaslan, Bram Kruseman, Ananta K. Majhi, Wilmar M. Heuvelman, Jennifer Dworak

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2012

2010

On Reducing Scan Shift Activity at RTL.

Elif Alpaslan, Yu Huang, Xijiang Lin, Wu-Tung Cheng, Jennifer Dworak

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2010

NIM- a noise index model to estimate delay discrepancies between silicon and simulation.

Elif Alpaslan, Jennifer Dworak, Bram Kruseman, Ananta K. Majhi, Wilmar M. Heuvelman, Paul van de Wiel

Proceedings of the Design, Automation and Test in Europe, 2010

2008

Reducing Scan Shift Power at RTL.

Elif Alpaslan, Yu Huang, Xijiang Lin, Wu-Tung Cheng, Jennifer Dworak

Proceedings of the 26th IEEE VLSI Test Symposium (VTS 2008), April 27, 2008