Elham K. Moghaddam

According to our database, Elham K. Moghaddam authored at least 20 papers between 2007 and 2021.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2021

Time and Area Optimized Testing of Automotive ICs.

Nilanjan Mukherjee, Daniel Tille, Mahendar Sapati, Yingdi Liu, Jeffrey Mayer, Sylwester Milewski, Elham K. Moghaddam, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer

IEEE Trans. Very Large Scale Integr. Syst., 2021

2019

Logic BIST With Capture-Per-Clock Hybrid Test Points.

Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jedrzej Solecki, Jerzy Tyszer, Justyna Zawada

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2019

Test Time and Area Optimized BrST Scheme for Automotive ICs.

Nilanjan Mukherjee, Jerzy Tyszer, Daniel Tille, Mahendar Sapati, Yingdi Liu, Jeffrey Mayer, Sylwester Milewski, Elham K. Moghaddam, Janusz Rajski, Jedrzej Solecki

Proceedings of the IEEE International Test Conference, 2019

2018

Hardware Protection via Logic Locking Test Points.

Michael Chen, Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Justyna Zawada

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018

2017

Embedded Deterministic Test Points.

Cesar Acero, Derek Feltham, Yingdi Liu, Elham K. Moghaddam, Nilanjan Mukherjee, Marek Patyra, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Justyna Zawada

IEEE Trans. Very Large Scale Integr. Syst., 2017

2016

On New Test Points for Compact Cell-Aware Tests.

Cesar Acero, Derek Feltham, Marek Patyra, Friedrich Hapke, Elham K. Moghaddam, Nilanjan Mukherjee, Vidya Neerkundar, Janusz Rajski, Jerzy Tyszer, Justyna Zawada

IEEE Des. Test, 2016

Test point insertion in hybrid test compression/LBIST architectures.

Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Justyna Zawada

Proceedings of the 2016 IEEE International Test Conference, 2016

Minimal area test points for deterministic patterns.

Yingdi Liu, Elham K. Moghaddam, Nilanjan Mukherjee, Sudhakar M. Reddy, Janusz Rajski, Jerzy Tyszer

Proceedings of the 2016 IEEE International Test Conference, 2016

On Test Points Enhancing Hardware Security.

Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer, Justyna Zawada

Proceedings of the 25th IEEE Asian Test Symposium, 2016

2015

Isometric Test Data Compression.

Amit Kumar, Mark Kassab, Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Chen Wang

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015

Embedded deterministic test points for compact cell-aware tests.

Cesar Acero, Derek Feltham, Friedrich Hapke, Elham K. Moghaddam, Nilanjan Mukherjee, Vidya Neerkundar, Marek Patyra, Janusz Rajski, Jerzy Tyszer, Justyna Zawada

Proceedings of the 2015 IEEE International Test Conference, 2015

Design for low test pattern counts.

Haluk Konuk, Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Deepak Solanki, Jerzy Tyszer, Justyna Zawada

Proceedings of the 52nd Annual Design Automation Conference, 2015

2014

Isometric test compression with low toggling activity.

Amit Kumar, Mark Kassab, Elham K. Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer, Chen Wang

Proceedings of the 2014 International Test Conference, 2014

2011

Low power compression utilizing clock-gating.

Janusz Rajski, Elham K. Moghaddam, Sudhakar M. Reddy

Proceedings of the 2011 IEEE International Test Conference, 2011

Low Test Data Volume Low Power At-Speed Delay Tests Using Clock-Gating.

Elham K. Moghaddam, Janusz Rajski, Sudhakar M. Reddy, Jakub Janicki

Proceedings of the 20th IEEE Asian Test Symposium, 2011

Power Aware Embedded Test.

Xijiang Lin, Elham K. Moghaddam, Nilanjan Mukherjee, Benoit Nadeau-Dostie, Janusz Rajski, Jerzy Tyszer

Proceedings of the 20th IEEE Asian Test Symposium, 2011

2010

At-speed scan test with low switching activity.

Elham K. Moghaddam, Janusz Rajski, Sudhakar M. Reddy, Mark Kassab

Proceedings of the 28th IEEE VLSI Test Symposium, 2010

Low capture power at-speed test in EDT environment.

Elham K. Moghaddam, Janusz Rajski, Sudhakar M. Reddy, Xijiang Lin, Nilanjan Mukherjee, Mark Kassab

Proceedings of the 2011 IEEE International Test Conference, 2010

2007

An On-Line BIST Technique for Stuck-Open Fault Detection in CMOS Circuits.

Elham K. Moghaddam, Shaahin Hessabi

Proceedings of the Tenth Euromicro Conference on Digital System Design: Architectures, 2007

An On-Line BIST Technique for Delay Fault Detection in CMOS Circuits.

Elham K. Moghaddam, Shaahin Hessabi

Proceedings of the 16th Asian Test Symposium, 2007